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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 39, Iss. 13 — May. 1, 2000
  • pp: 2078–2080

Phase retardometer: a proposed device for measuring phase retardance

Nabil N. Nagib  »View Author Affiliations


Applied Optics, Vol. 39, Issue 13, pp. 2078-2080 (2000)
http://dx.doi.org/10.1364/AO.39.002078


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Abstract

The realization of a standard device for measuring phase retardance has been retarded by the lack of a simple underlying physical concept that can be formulated in a simple mathematical expression to provide quick, direct, and accurate results. A proposed device that meets these requirements and simple formulas for retardance measurements are presented.

© 2000 Optical Society of America

OCIS Codes
(050.5080) Diffraction and gratings : Phase shift
(120.4570) Instrumentation, measurement, and metrology : Optical design of instruments
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(260.5430) Physical optics : Polarization

History
Original Manuscript: September 10, 1999
Revised Manuscript: February 2, 2000
Published: May 1, 2000

Citation
Nabil N. Nagib, "Phase retardometer: a proposed device for measuring phase retardance," Appl. Opt. 39, 2078-2080 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-13-2078

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