OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 39, Iss. 13 — May. 1, 2000
  • pp: 2078–2080

Phase retardometer: a proposed device for measuring phase retardance

Nabil N. Nagib  »View Author Affiliations


Applied Optics, Vol. 39, Issue 13, pp. 2078-2080 (2000)
http://dx.doi.org/10.1364/AO.39.002078


View Full Text Article

Enhanced HTML    Acrobat PDF (58 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

The realization of a standard device for measuring phase retardance has been retarded by the lack of a simple underlying physical concept that can be formulated in a simple mathematical expression to provide quick, direct, and accurate results. A proposed device that meets these requirements and simple formulas for retardance measurements are presented.

© 2000 Optical Society of America

OCIS Codes
(050.5080) Diffraction and gratings : Phase shift
(120.4570) Instrumentation, measurement, and metrology : Optical design of instruments
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(260.5430) Physical optics : Polarization

History
Original Manuscript: September 10, 1999
Revised Manuscript: February 2, 2000
Published: May 1, 2000

Citation
Nabil N. Nagib, "Phase retardometer: a proposed device for measuring phase retardance," Appl. Opt. 39, 2078-2080 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-13-2078


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. H. G. Jerrard, “The calibration of quarter-wave plates,” J. Opt. Soc. Am. 42, 159–165 (1952). [CrossRef]
  2. J. M. Bennett, H. E. Bennett, “Polarization,” in Handbook of Optics, W. G. Driscoll, ed. (McGraw-Hill, New York, 1978), Chap. 10, pp. 129–140.
  3. W. G. Oldham, “Ellipsometry using a retardation plate as compensator,” J. Opt. Soc. Am. 57, 617–624 (1967). [CrossRef]
  4. F. L. McCrackin, “Analyses and corrections of instrumental errors in ellipsometry,” J. Opt. Soc. Am. 60, 57–63 (1970). [CrossRef]
  5. Kh. K. Aben, “Phase plates in the measurement of phase difference,” Opt. Spectrosc. (USSR) 14, 124–127 (1963).
  6. D. A. Holmes, D. L. Feucht, “Formulas for using wave plates in ellipsometry,” J. Opt. Soc. Am. 57, 466–472 (1967). [CrossRef] [PubMed]
  7. J. A. Johnson, N. M. Bashara, “General equations of symmetrical ellipsometer arrangements,” J. Opt. Soc. Am. 60, 221–224 (1970). [CrossRef]
  8. W. A. Shurcliff, Polarized Light (Harvard U. Press, Cambridge, Mass., 1962), pp. 165–170.
  9. M. S. El-Bahrawi, N. N. Nagib, S. A. Khodier, H. M. Sidki, “Birefringence of muscovite mica,” Opt. Laser Technol. 30, 411–415 (1998). [CrossRef]
  10. K. B. Rochford, C. M. Wang, “Uncertainty in null polarimeter measurements,” (National Institute of Standards and Technology, Boulder, Colo., 1996).

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

Figures

Fig. 1
 

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited