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Applied Optics

Applied Optics


  • Vol. 39, Iss. 13 — May. 1, 2000
  • pp: 2081–2083

Visualization of two-dimensional phase gradients by subtraction of a reference periodic pattern

César D. Perciante and José A. Ferrari  »View Author Affiliations

Applied Optics, Vol. 39, Issue 13, pp. 2081-2083 (2000)

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We describe a simple method for visualization of phase objects. The phase object is placed between a printed two-dimensional periodic pattern and a CCD camera. The ray deflection that is due to the phase object distorts the image of the pattern. This image is subtracted from a reference image and then, by squaring and low-pass filtering, a measurement of the two-dimensional refractive-index changes is obtained. Because the optical system does not require special alignment or illumination, the method presented has potential application for detection of gas leaks in industrial environments.

© 2000 Optical Society of America

OCIS Codes
(100.5070) Image processing : Phase retrieval
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

Original Manuscript: October 6, 1999
Revised Manuscript: January 6, 2000
Published: May 1, 2000

César D. Perciante and José A. Ferrari, "Visualization of two-dimensional phase gradients by subtraction of a reference periodic pattern," Appl. Opt. 39, 2081-2083 (2000)

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