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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 39, Iss. 13 — May. 1, 2000
  • pp: 2140–2144

Monitoring of multimode imaging devices by use of optical low-coherence reflectometers in reflection and transmission modes

Yaneck Gottesman, Elchuri V. K. Rao, Béatrice Dagens, and Stéphane Lovisa  »View Author Affiliations


Applied Optics, Vol. 39, Issue 13, pp. 2140-2144 (2000)
http://dx.doi.org/10.1364/AO.39.002140


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Abstract

The broadband source of a high-precision optical low-coherence reflectometer is simultaneously employed in conventional reflection and transmission modes to monitor the internal properties of multimode imaging (MMI) devices. Using two carefully chosen examples, we show that this new methodology should permit precise assessment of the performance of MMI devices, including backreflection and internal reflection as well as the imbalance between output waveguides.

© 2000 Optical Society of America

OCIS Codes
(120.4800) Instrumentation, measurement, and metrology : Optical standards and testing
(120.5700) Instrumentation, measurement, and metrology : Reflection
(120.7000) Instrumentation, measurement, and metrology : Transmission
(130.0130) Integrated optics : Integrated optics
(130.3120) Integrated optics : Integrated optics devices

History
Original Manuscript: August 6, 1999
Revised Manuscript: January 28, 2000
Published: May 1, 2000

Citation
Yaneck Gottesman, Elchuri V. K. Rao, Béatrice Dagens, and Stéphane Lovisa, "Monitoring of multimode imaging devices by use of optical low-coherence reflectometers in reflection and transmission modes," Appl. Opt. 39, 2140-2144 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-13-2140

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