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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 39, Iss. 13 — May. 1, 2000
  • pp: 2167–2173

Measurement of the relative optical phase between amorphous and crystalline regions of the phase-change media of optical recording

Rongguang Liang, J. Kevin Erwin, and Masud Mansuripur  »View Author Affiliations


Applied Optics, Vol. 39, Issue 13, pp. 2167-2173 (2000)
http://dx.doi.org/10.1364/AO.39.002167


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Abstract

We describe a method of measuring the relative optical phase on reflection between amorphous and crystalline regions of the phase-change media of optical data storage. With a red He–Ne laser (wavelength, 632.8 nm) the relative phases on two quadrilayer optical disk stacks were measured and found to be ∼40°. The results are in good agreement with the calculated values based on the known layer thicknesses and refractive indices of the stacks. For calibration purposes the height of a known step on an otherwise flat silicon substrate was measured with the same apparatus. The proposed method is fairly simple to set up, can measure both front-surface and through-substrate types of optical disk, and can be used with any laser that has long coherence length.

© 2000 Optical Society of America

OCIS Codes
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(210.0210) Optical data storage : Optical data storage
(210.4590) Optical data storage : Optical disks
(210.4770) Optical data storage : Optical recording
(210.4810) Optical data storage : Optical storage-recording materials

History
Original Manuscript: September 28, 1999
Revised Manuscript: January 31, 2000
Published: May 1, 2000

Citation
Rongguang Liang, J. Kevin Erwin, and Masud Mansuripur, "Measurement of the relative optical phase between amorphous and crystalline regions of the phase-change media of optical recording," Appl. Opt. 39, 2167-2173 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-13-2167


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References

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  2. C. Peng, W. H. Yeh, M. Mansuripur, “Measurements and simulations of differential phase-tracking signals in optical disk data storage,” Appl. Opt. 37, 4425–4432 (1998). [CrossRef]
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  9. M. Mansuripur, “Analysis of multilayer thin-film structures containing magneto-optic and anisotropic media at oblique incidence using 2 x 2 matrices,” J. Appl. Phys. 67, 6466–6475 (1990). [CrossRef]

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