Phase Measurements With Wide-Aperture Interferometers
Applied Optics, Vol. 39, Issue 14, pp. 2326-2331 (2000)
http://dx.doi.org/10.1364/AO.39.002326
Acrobat PDF (264 KB)
Abstract
An interferogram produced by wide-aperture interferometers is studied both theoretically and experimentally. The fringe spacing is shown to increase nonlinearly with the numerical aperture and the fringe envelope to become narrower as the numerical aperture is increased. Phase measurements with wide-aperture interferometers therefore require calibration, and the phase can be measured only over a limited range. A calibration is given for accurate phase measurements, and the range over which the phase can be measured is calculated. Experimental measurements are presented and compared with theory.
© 2000 Optical Society of America
[Optical Society of America ]
OCIS Codes
(120.2830) Instrumentation, measurement, and metrology : Height measurements
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(180.3170) Microscopy : Interference microscopy
Citation
Arnaud Dubois, Juliette Selb, Laurent Vabre, and Albert-Claude Boccara, "Phase Measurements With Wide-Aperture Interferometers," Appl. Opt. 39, 2326-2331 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-14-2326
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
Related Journal Articles 
- Interfacial shape and contact-angle measurement of transparent samples with confocal interference microscopy (OL)
- Interfacial shape and contact-angle measurement of transparent samples with confocal interference microscopy: a publisher's erratum (OL)
- Phase-shifted laser feedback interferometry (OL)
- Interferometric Back Focal Plane Microellipsometry (AO)
- Effects of Phase Change on Reflection in Phase-Measuring Interference Microscopy (AO)
Related Conference Papers
- Laboratory Demonstration of Low Earth Orbit Inter-Satellite Interferometric Ranging
- Profilometry Using a Frequency-Shifted Feedback Laser
- Phase measurement of periodic optical pulses usingthe temporal fractional Talbot effect
- Surface figure determination of vibrating optical membrane
- Laser-induced femtosecond explosion dynamics of clusters and its affect on pulse self-focusing
« Previous Article | Next Article »
OSA is a member of 