We describe a method to estimate the thermal conductivity of the substrate, the dielectric layer, the phase-change (PC) layer, and the reflective layer of PC optical recording media. The method relies on the amorphous-to-crystalline phase transition that occurs in the PC layer and takes advantage of the difference in the thermal diffusion behavior under different-sized focused spots. All the results obtained here are reliable with better than ∓5% accuracy, which is within the margin of our experimental error.
© 2000 Optical Society of America
(210.0210) Optical data storage : Optical data storage
(210.4590) Optical data storage : Optical disks
(210.4770) Optical data storage : Optical recording
(210.4810) Optical data storage : Optical storage-recording materials
Chubing Peng and M. Mansuripur, "Measurement of the Thermal Conductivity of Erasable Phase-Change Optical Recording Media," Appl. Opt. 39, 2347-2352 (2000)