Fiber-Optic Surface-Plasmon Resonance for the Determination of Thickness and Optical Constants of Thin Metal Films
Applied Optics, Vol. 39, Issue 19, pp. 3261-3265 (2000)
http://dx.doi.org/10.1364/AO.39.003261
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Abstract
We demonstrate that the thickness and the dielectric constants of thin gold films deposited on the surface of a fiber core can be quantitatively determined as a single set of solutions by the simple measurement of the fiber-optic surface-plasmon resonance responses. This method is capable of directly characterizing metal films with curved surfaces: this is very hard to perform by use of the conventional optical techniques of reflectometry and ellipsometry. The theoretical errors for the experimental fiber are estimated to be within d ∓ 2%, εr ∓ 1%, and εi ∓ 15%.
© 2000 Optical Society of America
[Optical Society of America ]
OCIS Codes
(060.2370) Fiber optics and optical communications : Fiber optics sensors
(120.1880) Instrumentation, measurement, and metrology : Detection
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(240.0310) Optics at surfaces : Thin films
(240.6680) Optics at surfaces : Surface plasmons
Citation
Wen Bin Lin, Jean Marc Chovelon, and Nicole Jaffrezic-Renault, "Fiber-Optic Surface-Plasmon Resonance for the Determination of Thickness and Optical Constants of Thin Metal Films," Appl. Opt. 39, 3261-3265 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-19-3261
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