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Applied Optics

Applied Optics


  • Vol. 39, Iss. 19 — Jul. 1, 2000
  • pp: 3261–3265

Fiber-optic surface-plasmon resonance for the determination of thickness and optical constants of thin metal films

Wen Bin Lin, Jean Marc Chovelon, and Nicole Jaffrezic-Renault  »View Author Affiliations

Applied Optics, Vol. 39, Issue 19, pp. 3261-3265 (2000)

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We demonstrate that the thickness and the dielectric constants of thin gold films deposited on the surface of a fiber core can be quantitatively determined as a single set of solutions by the simple measurement of the fiber-optic surface-plasmon resonance responses. This method is capable of directly characterizing metal films with curved surfaces: this is very hard to perform by use of the conventional optical techniques of reflectometry and ellipsometry. The theoretical errors for the experimental fiber are estimated to be within d ± 2%, ∊ r ± 1%, and ∊ i ± 15%.

© 2000 Optical Society of America

OCIS Codes
(060.2370) Fiber optics and optical communications : Fiber optics sensors
(120.1880) Instrumentation, measurement, and metrology : Detection
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(240.0310) Optics at surfaces : Thin films
(240.6680) Optics at surfaces : Surface plasmons

Original Manuscript: October 29, 1999
Revised Manuscript: February 22, 2000
Published: July 1, 2000

Wen Bin Lin, Jean Marc Chovelon, and Nicole Jaffrezic-Renault, "Fiber-optic surface-plasmon resonance for the determination of thickness and optical constants of thin metal films," Appl. Opt. 39, 3261-3265 (2000)

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