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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 39, Iss. 19 — Jul. 1, 2000
  • pp: 3285–3288

Temporal phase unwrapping applied to wavelength-scanning interferometry

Lars Paulsson, Mikael Sjödahl, Jun-ichi Kato, and Ichirou Yamaguchi  »View Author Affiliations


Applied Optics, Vol. 39, Issue 19, pp. 3285-3288 (2000)
http://dx.doi.org/10.1364/AO.39.003285


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Abstract

We demonstrate the use of temporal phase unwrapping in combination with wavelength-scanning interferometry. Two unwrapping strategies are considered: fitting to a reversed exponential sequence and complex Fourier-transform ranging. Measurement of a 10-µm step by use of an external-cavity laser diode is discussed.

© 2000 Optical Society of America

OCIS Codes
(100.0100) Image processing : Image processing
(100.2650) Image processing : Fringe analysis
(100.6890) Image processing : Three-dimensional image processing
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3940) Instrumentation, measurement, and metrology : Metrology

History
Original Manuscript: September 21, 1999
Revised Manuscript: March 30, 2000
Published: July 1, 2000

Citation
Lars Paulsson, Mikael Sjödahl, Jun-ichi Kato, and Ichirou Yamaguchi, "Temporal phase unwrapping applied to wavelength-scanning interferometry," Appl. Opt. 39, 3285-3288 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-19-3285

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