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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 39, Iss. 19 — Jul. 1, 2000
  • pp: 3333–3337

Fast imaging of hard x rays with a laboratory microscope

Alex S. Bakulin, Stephen M. Durbin, Terrence Jach, and Joseph Pedulla  »View Author Affiliations


Applied Optics, Vol. 39, Issue 19, pp. 3333-3337 (2000)
http://dx.doi.org/10.1364/AO.39.003333


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Abstract

An improved x-ray microscope with a fully electronic CCD detector system has been constructed that allows improved laboratory-based microstructural investigations of materials with hard x rays. It uses the Kirkpatrick–Baez multilayer mirror design to form an image that has a demonstrated resolution of 4 µm at 8 keV (Cu Kα radiation). This microscope performs well with standard sealed-tube laboratory x-ray sources, producing digital images with 20-s exposure times for a 5-µm Au grid (a thickness of two absorption lengths).

© 2000 Optical Society of America

OCIS Codes
(340.0340) X-ray optics : X-ray optics
(340.7440) X-ray optics : X-ray imaging
(340.7460) X-ray optics : X-ray microscopy

History
Original Manuscript: December 2, 1999
Revised Manuscript: April 6, 2000
Published: July 1, 2000

Citation
Alex S. Bakulin, Stephen M. Durbin, Terrence Jach, and Joseph Pedulla, "Fast imaging of hard x rays with a laboratory microscope," Appl. Opt. 39, 3333-3337 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-19-3333


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References

  1. Z. H. Levine, A. R. Kalukin, S. P. Frigo, I. McNulty, M. Kuhn, “Tomographic reconstruction of an integrated circuit interconnect,” Appl. Phys. Lett. 74, 150–152 (1999). [CrossRef]
  2. P. Spanne, J. H. Thovert, C. J. Jacquin, W. B. Lindquist, K. W. Jones, P. M. Adler, “Synchrotron computed microtomography of porous media—topology and transports,” Phys. Rev. Lett. 73, 2001–2004 (1994). [CrossRef] [PubMed]
  3. T. E. Gureyev, C. Raven, A. Snigirev, I. Snigireva, S. W. Wilkins, “Hard x-ray quantitative non-interferometric phase-contrast microscopy,” J. Phys. D 32, 563–567 (1999). [CrossRef]
  4. A. Bakulin, S. M. Durbin, C. Liu, J. Erdmann, A. T. Macrander, T. Jach, “Use of Kirkpatrick-Baez multilayer optics for x-ray fluorescence imaging,” in Crystal and Multilayer Optics, A. T. Macrander, A. K. Freund, T. Ishikawa, D. M. Mills, eds., Proc. SPIE3448, 218–223 (1998). [CrossRef]
  5. P. Kirkpatrick, A. Baez, “Formation of optical images by x-rays,” J. Opt. Soc. Am. 38, 766–774 (1948). [CrossRef] [PubMed]
  6. J. F. McGee, “A long wavelength x-ray microscope,” in X-Ray Microscopy and Microradiography, V. E. Coslett, A. Engstrom, H. H. Pattee, eds. (Academic, New York, 1957), pp. 164–176.
  7. J. H. Underwood, T. W. Barbee, C. Frieber, “X-ray microscope with multilayer mirrors,” Appl. Opt. 25, 1730–1732 (1986). [CrossRef] [PubMed]
  8. J. H. Underwood, “High-energy x-ray microscopy with multilayer reflectors,” Rev. Sci. Instrum. 57, 2119–2123 (1986). [CrossRef]
  9. J. H. Underwood, A. C. Thompson, Y. Wu, R. D. Giauque, “X-ray microprobe using multilayer mirrors,” Nucl. Instrum. Methods Phys. Res. A 266, 296–302 (1988). [CrossRef]
  10. A. C. Thompson, J. H. Underwood, Y. Wu, R. D. Giauque, K. W. Jones, M. L. Rivers, “Elemental measurements with an x-ray microprobe of biological and geological samples with femtogram sensitivity,” Nucl. Instrum. Methods A 266, 318–323 (1988). [CrossRef]
  11. Y. Wu, A. C. Thompson, J. H. Underwood, R. D. Giauque, K. Chapman, M. L. Rivers, K. W. Jones, “A tunable x-ray microprobe using synchrotron radiation,” Nucl. Instrum. Methods A 291, 146–151 (1990). [CrossRef]
  12. Y. Suzuki, F. Uchida, “Hard x-ray microprobe with total reflection mirrors,” Rev. Sci. Instrum. A 345, 578–580 (1992). [CrossRef]
  13. C. Kunz, “X-ray microscopy,” Phys. Scr. T61, 19–25 (1996). [CrossRef]
  14. J. Cazaux, D. Erre, D. Mouze, J. M. Patat, S. Rondot, A. Sasov, P. Trebbia, A. Zolfaghari, “Recent developments in x-ray projection microscopy and x-ray microtomography applied to materials science,” J. Phys. (Paris) IV 3, 2099–2104 (1993).
  15. H. Elhila, A. Zolfaghari, J. Cazaux, J. C. Audran, D. Mouze, “X-ray microscopy and microtomography: application in biology,” J. Phys. (Paris) IV 6, 739–745 (1996).
  16. D. Erre, H. Jibaoui, J. Cazaux, “X-ray microscopy by total reflectivity and grazing incidence Kossel diffraction,” J. Phys. (Paris) IV 6, 393–398 (1996).
  17. D. Erre, E. Bourelle, B. Claude-Montigny, A. Metrot, J. Cazaux, “Following the intercalation process of H2SO4 into pyrographite by x-ray microscopy,” Phys. Rev. Sect. B 56, 4944–4948 (1997). [CrossRef]
  18. C. Welnak, G. Chen, F. Cerrina, “Shadow: a synchrotron radiation and x-ray optics simulation tool,” Nucl. Instrum. Methods Phys. Res. A 347, 344–347 (1994). [CrossRef]
  19. R. N. Watts, D. L. Ederer, R. D. Deslattes, T. B. Lucatorto, W. T. Estler, C. J. Evans, T. V. Vorburger, “Upgraded facility for multilayer mirror characterization at NIST,” in Multilayer Optics for Advanced X-Ray Applications, N. M. Ceglio, ed., Proc. SPIE1547, 159–166 (1991). [CrossRef]
  20. V. G. Kohn, “On the theory of reflectivity by an x-ray multilayer mirror,” Phys. Status Solidi B 187, 61–70 (1995). [CrossRef]
  21. T. Wroblewski, O. Glaub, H.-A. Crostack, A. Ertel, F. Fandrich, Ch. Genzel, K. Hradil, W. Ternes, E. Woldt, “A new diffractometer for materials science and imaging at HASYLAB beamline G3,” Nucl. Instrum. Methods A 428, 570–582 (1999). [CrossRef]

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