Pulsed Digital Holographic Interferometry With 694- and 347-nm Wavelengths
Applied Optics, Vol. 39, Issue 2, pp. 246-249 (2000)
http://dx.doi.org/10.1364/AO.39.000246
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Abstract
A method for deformation analysis and shape measurement based on digital holography is presented. Two wavelengths, 694 and 347 nm, are used. The object is illuminated with the two wavelengths at the same time, and digital holograms are recorded on a CCD chip. The information corresponding to the two wavelengths is separated in the Fourier domain, and the phase corresponding to the wave fronts is calculated. By recording holograms with two different wavelengths at the same time, we can get measurements of deformations or shape with different sensitivities. Experimental results are presented.
© 2000 Optical Society of America
[Optical Society of America ]
OCIS Codes
(070.2580) Fourier optics and signal processing : Paraxial wave optics
(070.2590) Fourier optics and signal processing : ABCD transforms
(090.1760) Holography : Computer holography
(090.2880) Holography : Holographic interferometry
(100.2650) Image processing : Fringe analysis
(190.2620) Nonlinear optics : Harmonic generation and mixing
Citation
Giancarlo Pedrini, Hans J. Tiziani, and Mikhail E. Gusev, "Pulsed Digital Holographic Interferometry With 694- and 347-nm Wavelengths," Appl. Opt. 39, 246-249 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-2-246
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