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Applied Optics

Applied Optics


  • Vol. 39, Iss. 2 — Jan. 10, 2000
  • pp: 293–301

Analysis and characterization of alignment for free-space optical interconnects based on singular-value decomposition

Makoto Naruse and Masatoshi Ishikawa  »View Author Affiliations

Applied Optics, Vol. 39, Issue 2, pp. 293-301 (2000)

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We propose a theoretical method to analyze and characterize the alignment of optical systems by using a singular-value decomposition (SVD) technique. One application of this method is to identify critical parameters for alignment systematically during alignment of two-dimensional device arrays. Another example application is to characterize the sensitivity or the accuracy of the misalignment-detection capability by evaluation of the singular values of optical systems. The information obtained through SVD-based techniques yields critical insights into the analysis of alignment.

© 2000 Optical Society of America

OCIS Codes
(130.3120) Integrated optics : Integrated optics devices
(200.4650) Optics in computing : Optical interconnects
(220.1140) Optical design and fabrication : Alignment
(250.3140) Optoelectronics : Integrated optoelectronic circuits

Original Manuscript: March 1, 1999
Revised Manuscript: October 21, 1999
Published: January 10, 2000

Makoto Naruse and Masatoshi Ishikawa, "Analysis and characterization of alignment for free-space optical interconnects based on singular-value decomposition," Appl. Opt. 39, 293-301 (2000)

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