We propose a theoretical method to analyze and characterize the alignment of optical systems by using a singular-value decomposition (SVD) technique. One application of this method is to identify critical parameters for alignment systematically during alignment of two-dimensional device arrays. Another example application is to characterize the sensitivity or the accuracy of the misalignment-detection capability by evaluation of the singular values of optical systems. The information obtained through SVD-based techniques yields critical insights into the analysis of alignment.
© 2000 Optical Society of America
(130.3120) Integrated optics : Integrated optics devices
(200.4650) Optics in computing : Optical interconnects
(220.1140) Optical design and fabrication : Alignment
(250.3140) Optoelectronics : Integrated optoelectronic circuits
Makoto Naruse and Masatoshi Ishikawa, "Analysis and Characterization of Alignment for Free-Space Optical Interconnects Based on Singular-Value Decomposition," Appl. Opt. 39, 293-301 (2000)