OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 39, Iss. 22 — Aug. 1, 2000
  • pp: 3805–3813

Reflection optical encoders as three-grating moiré systems

Daniel Crespo, Jose Alonso, and Eusebio Bernabeu  »View Author Affiliations


Applied Optics, Vol. 39, Issue 22, pp. 3805-3813 (2000)
http://dx.doi.org/10.1364/AO.39.003805


View Full Text Article

Enhanced HTML    Acrobat PDF (160 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

Reflection optical encoders are studied as three-grating moiré systems. An analysis is made of the differences that may appear between it and the standard case in which an optical encoder is regarded as a two-grating system.

© 2000 Optical Society of America

OCIS Codes
(050.1940) Diffraction and gratings : Diffraction
(050.1950) Diffraction and gratings : Diffraction gratings
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.4120) Instrumentation, measurement, and metrology : Moire' techniques
(120.5700) Instrumentation, measurement, and metrology : Reflection

History
Original Manuscript: January 12, 2000
Revised Manuscript: April 20, 2000
Published: August 1, 2000

Citation
Daniel Crespo, Jose Alonso, and Eusebio Bernabeu, "Reflection optical encoders as three-grating moiré systems," Appl. Opt. 39, 3805-3813 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-22-3805


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. K. Patorski, Handbook of the Moiré Fringe Technique (Elsevier, Amsterdam, The Netherlands, 1993), Chap. 5, pp. 99–139.
  2. F. Talbot, “Facts relating to optical science: Number IV,” Philos. Mag. 9, 401–407 (1836).
  3. A. Olszak, L. Wronkowski, “Analysis of the Fresnel field of a double diffraction system in the case of two amplitude diffraction gratings under partially coherent illumination,” Opt. Eng. 36, 2149–2157 (1997). [CrossRef]
  4. E. Keren, O. Kafri, “Diffraction effects in moiré deflectometry,” J. Opt. Soc. Am. A 2, 111–120 (1985). [CrossRef]
  5. K. Patorski, Moiré Metrology (Pergamon, New York, 1998).
  6. G. N. Rassudova, “Moiré interference fringes in a system consisting of a transmission and a reflection diffraction grating. Part I,” Opt. Spectrosc. 22, 73–78 (1967); G. N. Rassudova, “Moiré interference fringes in a system consisting of a transmission and a reflection diffraction grating. Part II,” Opt. Spectrosc. 22, 255–258 (1967); G. N. Rassudova, “Moiré interference fringes in a system consisting of a transmission and a reflection diffraction grating. Part III,” Opt. Spectrosc. 22, 335–340 (1967).
  7. L. Liu, X. Liu, L. Ye, “Joint Talbot effect and logic-operated moiré patterns,” J. Opt. Soc. Am. A 7, 970–976 (1990). [CrossRef]
  8. L. Wronkowski, “Diffraction model of an optoelectronic displacement measuring transducer,” Opt. Laser Technol. 27, 81–88 (1995). [CrossRef]
  9. L. Wronkowski, “Opto-electronic analog-impulse transducer accuracy from the point of view of diffraction phenomena,” in New Measurement Technology to Serve Mankind: Acta IMEKO 1985, Volume III. Measurement in Mechanics and Laser Metrology, G. Striker, T. Boromisza, T. Kemeny, eds. (Omikk-Technoinform, Budapest, Hungary, 1985), pp. 445–462.

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited