Birefringence Imaging with Imperfect Benches: Application to Large-Scale Birefringence Measurements
Applied Optics, Vol. 39, Issue 22, pp. 3864-3874 (2000)
http://dx.doi.org/10.1364/AO.39.003864
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Abstract
We describe a birefringence measurement bench that allows fast two-dimensional measurements of low-birefringence fields in large transparent samples. We present calculations that show that, even when a birefringence bench exhibits defects (nonideal components, misalignments, etc.), measurements can be performed under realistic conditions without any a priori knowledge of the origin of the bench defects. This allows the measurement of birefringence fields on large-scale samples by use of an array of detectors instead of a single detector element, with a sensitivity of 3 × 10−4 rad for 2-s data integration.
© 2000 Optical Society of America
[Optical Society of America ]
OCIS Codes
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(260.1440) Physical optics : Birefringence
Citation
Géraud de Villèle and Vincent Loriette, "Birefringence Imaging with Imperfect Benches: Application to Large-Scale Birefringence Measurements," Appl. Opt. 39, 3864-3874 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-22-3864
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