As a phase shifter usually suffers from both translational and tilt-shift errors during shifting, so every pixel in the same interferogram will have a different phase-shift value. Thus nonlinear phase-measurement errors cannot be avoided, but even translational-shift error has been corrected effectively. However, based on the fact that the shifted phases of all the pixels in the same interferogram remain on the phase-shift plane, by defining this plane one can eliminate a significant number of phase errors. A new algorithm that is immune to both translational- and tilt-shift errors in a phase shifter for phase-stepping interferometers is presented. A first-order Taylor series expansion replaces the nonlinear equations for defining the phase-shift plane, and iteration of the algorithm guarantees its accuracy. Results of a computer simulation show that phase-measurement errors caused by both translation- and tilt-shift error can be compensated for completely, even when the tilt-shift error is not more than ∓1%.
© 2000 Optical Society of America
[Optical Society of America ]
(050.5080) Diffraction and gratings : Phase shift
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
Mingyi Chen, Hongwei Guo, and Chunlong Wei, "Algorithm Immune to Tilt Phase-Shifting Error for Phase-Shifting Interferometers," Appl. Opt. 39, 3894-3898 (2000)