White-light vertical scanning interferometry is a well-established technique for retrieving the three-dimensional shapes of small objects, but it can measure only areas as big as the field of view of the instrument. For bigger fields a stitching algorithm must be applied, which often can be a source of errors. A technique in which the object is scanned laterally in front of an instrument with a tilted coherence plane is described. It permits measurements at higher speeds while measurement accuracy is retained and eliminates the need for stitching in one direction. Experimental confirmation is provided.
© 2000 Optical Society of America
Original Manuscript: February 16, 2000
Revised Manuscript: April 24, 2000
Published: August 1, 2000
Artur Olszak, "Lateral scanning white-light interferometer," Appl. Opt. 39, 3906-3913 (2000)