Diode-Pumped 214.8-nm Nd:YAG /Cr 4 +:YAG Microchip Laser System for the Detection of NO
Applied Optics, Vol. 39, Issue 24, pp. 4418-4424 (2000)
http://dx.doi.org/10.1364/AO.39.004418
Acrobat PDF (662 KB)
Abstract
A passively Q-switched 214.8-nm Nd:YAG/Cr4+:YAG microchip laser system for the detection of NO was designed, constructed, and tested. The system uses the fifth harmonic of the 1.074-μm transition in Nd:YAG to detect NO by laser-induced fluorescence. A significant challenge was the development of an environmentally stable coating to provide the necessary discrimination between the 1.074-μm laser line and the stronger transition at 1.064 μm. The exact position of the fifth-harmonic frequency was determined by use of NO fluorescence excitation spectra to be 46556 ∓ 1.5 cm−1. With a pulse energy of approximately 50 nJ of fifth-harmonic light, we observed a detection sensitivity for NO of approximately 15 parts per billion by volume in a simple, compact optical system.
© 2000 Optical Society of America
[Optical Society of America ]
OCIS Codes
(140.3530) Lasers and laser optics : Lasers, neodymium
(140.3580) Lasers and laser optics : Lasers, solid-state
(190.4160) Nonlinear optics : Multiharmonic generation
(300.2530) Spectroscopy : Fluorescence, laser-induced
(300.6360) Spectroscopy : Spectroscopy, laser
(300.6540) Spectroscopy : Spectroscopy, ultraviolet
Citation
J. Wormhoudt, J. H. Shorter, C. C. Cook, and J. J. Zayhowski, "Diode-Pumped 214.8-nm Nd:YAG /Cr 4 +:YAG Microchip Laser System for the Detection of NO," Appl. Opt. 39, 4418-4424 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-24-4418
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