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Applied Optics

Applied Optics


  • Vol. 39, Iss. 25 — Sep. 1, 2000
  • pp: 4598–4606

Spatial versus temporal phase shifting in electronic speckle-pattern interferometry: noise comparison in phase maps

Jan Burke and Heinz Helmers  »View Author Affiliations

Applied Optics, Vol. 39, Issue 25, pp. 4598-4606 (2000)

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Temporal and spatial phase shifting in electronic speckle-pattern interferometry are compared quantitatively with respect to the quality of the resultant deformation phase maps. On the basis of an analysis of the noise in sawtooth fringes a figure of merit is defined and measured for various in-plane and out-of-plane sensitive electronic speckle-pattern interferometry configurations. Varying quantities like the object-illuminating intensity, the beam ratio, the speckle size and shape, and the fringe density allows characteristic behaviors of both phase-shifting methods to be explored.

© 2000 Optical Society of America

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry

Original Manuscript: February 8, 2000
Revised Manuscript: May 25, 2000
Published: September 1, 2000

Jan Burke and Heinz Helmers, "Spatial versus temporal phase shifting in electronic speckle-pattern interferometry: noise comparison in phase maps," Appl. Opt. 39, 4598-4606 (2000)

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