Spatial Versus Temporal Phase Shifting in Electronic Speckle-Pattern Interferometry: Noise Comparison in Phase Maps
Applied Optics, Vol. 39, Issue 25, pp. 4598-4606 (2000)
http://dx.doi.org/10.1364/AO.39.004598
Acrobat PDF (158 KB)
Abstract
Temporal and spatial phase shifting in electronic speckle-pattern interferometry are compared quantitatively with respect to the quality of the resultant deformation phase maps. On the basis of an analysis of the noise in sawtooth fringes a figure of merit is defined and measured for various in-plane and out-of-plane sensitive electronic speckle-pattern interferometry configurations. Varying quantities like the object-illuminating intensity, the beam ratio, the speckle size and shape, and the fringe density allows characteristic behaviors of both phase-shifting methods to be explored.
© 2000 Optical Society of America
[Optical Society of America ]
OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry
Citation
Jan Burke and Heinz Helmers, "Spatial Versus Temporal Phase Shifting in Electronic Speckle-Pattern Interferometry: Noise Comparison in Phase Maps," Appl. Opt. 39, 4598-4606 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-25-4598
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
Related Journal Articles 
- Complex Division as a Common Basis for Calculating Phase Differences in Electronic Speckle Pattern Interferometry in One Step (AO)
- Evaluation of a Preconditioned Conjugate-Gradient Algorithm for Weighted Least-Squares Unwrapping of Digital Speckle-Pattern Interferometry Phase Maps (AO)
- Unwrapping of Digital Speckle-Pattern Interferometry Phase Maps by use of a Minimum L0-Norm Algorithm (AO)
- Phase-Shifted Dynamic Speckle Pattern Interferometry at 1 kHz (AO)
- Vibration-Induced Phase Errors in High-Speed Phase-Shifting Speckle-Pattern Interferometry (AO)
Related Conference Papers
- Characterization of Sub-10-fs Pulses Using Spatially Encoded Arrangement for SPIDER
- Two-Dimensional Spectral Shearing Interferometry (2DSI) for Ultrashort Pulse Characterization
- Analysis of Eyewear Glasses and Ophthalmic Lenses Using Fourier Interferometry
- Modified Formulation of Phase Gradient for Noise-Immune Phase Retrieval in Phase-Shifting Interferometry
- Modified Formulation of Phase Gradient for Noise-Immune Phase Retrieval in Phase-Shifting Interferometry
« Previous Article | Next Article »
OSA is a member of 