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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 39, Iss. 25 — Sep. 1, 2000
  • pp: 4698–4705

Scattering of s-polarized electromagnetic plane waves from a film with a shallow random rough surface on a perfect conductor

Raúl García-Llamas and César Márquez-Beltran  »View Author Affiliations


Applied Optics, Vol. 39, Issue 25, pp. 4698-4705 (2000)
http://dx.doi.org/10.1364/AO.39.004698


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Abstract

Scattering of s-polarized electromagnetic planes waves from a film, with a shallow random rough one-dimensional surface, bounded by vacuum and a perfect conductor is calculated. An integral equation that relates the amplitude of the scattered field to the incident wave is found by use of the Rayleigh hypothesis. The integral equation is solved numerically and by use of the perturbation theory, up to the fourth order in the surface profile function. In the angular dependence of the incoherent part of the differential reflection coefficient, the backscattering peak and two additional satellite peaks are observed, owing to two guided waves supported by the film. Analysis of the perturbation solution reveals that the background scattering exhibits minima and maxima as functions of the thickness. By studying the behavior of the scattering as a function of the absorption index of the film, it is shown that the amplitudes of the peaks are low when k ∼ 10-2 and high when k ∼ 10-4.

© 2000 Optical Society of America

OCIS Codes
(030.0030) Coherence and statistical optics : Coherence and statistical optics
(290.0290) Scattering : Scattering
(290.1350) Scattering : Backscattering
(290.5880) Scattering : Scattering, rough surfaces
(310.0310) Thin films : Thin films
(310.2790) Thin films : Guided waves

History
Original Manuscript: November 22, 1999
Revised Manuscript: April 19, 2000
Published: September 1, 2000

Citation
Raúl García-Llamas and César Márquez-Beltran, "Scattering of s-polarized electromagnetic plane waves from a film with a shallow random rough surface on a perfect conductor," Appl. Opt. 39, 4698-4705 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-25-4698

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