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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 39, Iss. 28 — Oct. 1, 2000
  • pp: 5117–5124

Particle Positioning from Charge-Coupled Device Images by the Generalized Lorenz-Mie Theory and Comparison with Experiment

David Moreno, Fernando Mendoza Santoyo, J. Ascencion Guerrero, and Marcelo Funes-Gallanzi  »View Author Affiliations


Applied Optics, Vol. 39, Issue 28, pp. 5117-5124 (2000)
http://dx.doi.org/10.1364/AO.39.005117


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Abstract

Three-dimensional position and velocity information can be extracted by direct analysis of the diffraction patterns of seeding particles in imaging velocimetry with real-time CCD cameras. The generalized Lorenz–Mie theory is shown to yield quantitatively accurate models of particle position, such that it can be deduced from typical experimental particle images with an accuracy of the order of 20 μm and an error of 11 gray levels rms, data obtained by comparison of theoretical and experimental images. Both the theory and an experimental verification of the problem presented here are discussed.

© 2000 Optical Society of America

OCIS Codes
(040.1520) Detectors : CCD, charge-coupled device
(070.2580) Fourier optics and signal processing : Paraxial wave optics
(100.2000) Image processing : Digital image processing
(120.7250) Instrumentation, measurement, and metrology : Velocimetry
(290.4020) Scattering : Mie theory
(350.4990) Other areas of optics : Particles

Citation
David Moreno, Fernando Mendoza Santoyo, J. Ascencion Guerrero, and Marcelo Funes-Gallanzi, "Particle Positioning from Charge-Coupled Device Images by the Generalized Lorenz-Mie Theory and Comparison with Experiment," Appl. Opt. 39, 5117-5124 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-28-5117

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