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Applied Optics

Applied Optics


  • Vol. 39, Iss. 28 — Oct. 1, 2000
  • pp: 5138–5141

Multiplicative electronic speckle-pattern interferometry fringes

Noe Alcalá Ochoa, Fernando Mendoza Santoyo, Carlos Pérez López, and Bernardino Barrientos  »View Author Affiliations

Applied Optics, Vol. 39, Issue 28, pp. 5138-5141 (2000)

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A theoretical analysis of fringe patterns and its experimental corroboration obtained by multiplication of two speckled images with electronic speckle-pattern interferometry (ESPI) are reported. A specifically designed digital filter is used to enhance the contrast and visibility of the inherently noisy multiplication fringes. Phase retrieval is achieved by a phase-stepping technique. Experimental results are presented for the in-plane-sensitive optical ESPI setup; however, out-of-plane and shearing setups may be used as well. The method represents an alternative to the subtraction and addition techniques in ESPI.

© 2000 Optical Society of America

OCIS Codes
(120.2440) Instrumentation, measurement, and metrology : Filters
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry

Original Manuscript: March 27, 2000
Revised Manuscript: June 9, 2000
Published: October 1, 2000

Noe Alcalá Ochoa, Fernando Mendoza Santoyo, Carlos Pérez López, and Bernardino Barrientos, "Multiplicative electronic speckle-pattern interferometry fringes," Appl. Opt. 39, 5138-5141 (2000)

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