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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 39, Iss. 29 — Oct. 10, 2000
  • pp: 5360–5366

Continuous-wave Z-scan measurement of photorefractive SBN:60

Azad Siahmakoun, Detlef Breitling, and Reza A. Najaf-Zadeh  »View Author Affiliations


Applied Optics, Vol. 39, Issue 29, pp. 5360-5366 (2000)
http://dx.doi.org/10.1364/AO.39.005360


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Abstract

A cw-probe Z-scan technique was employed to measure the photoinduced index change in a photorefractive SBN:60 crystal. For this experiment a three-detector data-acquisition system was used to account for temporal changes in the laser. The effects of various beam parameters such as intensity, polarization, and wavelength were studied. A theoretical simulation of the Z scan based on a band-transport model of photorefractive-index variation was also developed. This model provides reasonable agreement with the experimental results.

© 2000 Optical Society of America

OCIS Codes
(160.4330) Materials : Nonlinear optical materials
(160.5320) Materials : Photorefractive materials
(190.4400) Nonlinear optics : Nonlinear optics, materials
(190.5330) Nonlinear optics : Photorefractive optics
(190.7070) Nonlinear optics : Two-wave mixing

History
Original Manuscript: August 6, 1999
Revised Manuscript: July 19, 2000
Published: October 10, 2000

Citation
Azad Siahmakoun, Detlef Breitling, and Reza A. Najaf-Zadeh, "Continuous-wave Z-scan measurement of photorefractive SBN:60," Appl. Opt. 39, 5360-5366 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-29-5360

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