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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 39, Iss. 29 — Oct. 10, 2000
  • pp: 5360–5366

Continuous-Wave Z-Scan Measurement of Photorefractive SBN:60

Azad Siahmakoun, Detlef Breitling, and Reza A. Najaf-Zadeh  »View Author Affiliations


Applied Optics, Vol. 39, Issue 29, pp. 5360-5366 (2000)
http://dx.doi.org/10.1364/AO.39.005360


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Abstract

A cw-probe <i>Z</i>-scan technique was employed to measure the photoinduced index change in a photorefractive SBN:60 crystal. For this experiment a three-detector data-acquisition system was used to account for temporal changes in the laser. The effects of various beam parameters such as intensity, polarization, and wavelength were studied. A theoretical simulation of the <i>Z</i> scan based on a band-transport model of photorefractive-index variation was also developed. This model provides reasonable agreement with the experimental results.

© 2000 Optical Society of America

OCIS Codes
(160.4330) Materials : Nonlinear optical materials
(160.5320) Materials : Photorefractive materials
(190.4400) Nonlinear optics : Nonlinear optics, materials
(190.5330) Nonlinear optics : Photorefractive optics
(190.7070) Nonlinear optics : Two-wave mixing

Citation
Azad Siahmakoun, Detlef Breitling, and Reza A. Najaf-Zadeh, "Continuous-Wave Z-Scan Measurement of Photorefractive SBN:60," Appl. Opt. 39, 5360-5366 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-29-5360


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References

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  7. D. Breitling and A. Siahmakoun, “Laser beam self-focusing and defocusing in a SBN:60,” Presented at the OSA Annual Meeting, Rochester, N.Y., 20–24 Oct. 1996 (Optical Society of America, Washington, D.C.).
  8. D. Breitling, “An investigation of self-focusing and defocusing in a SBN:60 crystal,” Master of Science thesis (Rose-Hulman Institute of Technology, Terre Haute, Ind., 1996).

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