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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 39, Iss. 31 — Nov. 1, 2000
  • pp: 5685–5693

Optical alignment-induced errors in holographic particle image velocimetry

Kevin Sholes and Patrick V. Farrell  »View Author Affiliations


Applied Optics, Vol. 39, Issue 31, pp. 5685-5693 (2000)
http://dx.doi.org/10.1364/AO.39.005685


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Abstract

A ray-tracing analysis of point-source imaging in the presence of optical misalignment is used to analyze relative image shift as a source of measurement error in holographic particle image velocimetry (HPIV). Although single-reference-beam HPIV is relatively insensitive to optical misalignment, dual-reference-beam systems may suffer substantial errors because of misalignments of the order of microradians. These systems are particularly sensitive to rotations of the hologram about an axis perpendicular to the film and to reconstruction beam misalignment. In a swirling flow experiment, a proposed error-compensation scheme was able to reduce uncertainty from 130% to 10% of the mean measured velocity.

© 2000 Optical Society of America

OCIS Codes
(090.1000) Holography : Aberration compensation
(090.4220) Holography : Multiplex holography
(120.7250) Instrumentation, measurement, and metrology : Velocimetry

History
Original Manuscript: April 17, 2000
Revised Manuscript: July 1, 2000
Published: November 1, 2000

Citation
Kevin Sholes and Patrick V. Farrell, "Optical alignment-induced errors in holographic particle image velocimetry," Appl. Opt. 39, 5685-5693 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-31-5685

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