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Applied Optics

Applied Optics


  • Vol. 39, Iss. 31 — Nov. 1, 2000
  • pp: 5750–5754

Measurement of the modal birefringence of single-mode K+ ion-exchanged planar waveguides with polarimetric interferometry

Zhi-mei Qi, Kiminori Itoh, and Masayuki Murabayashi  »View Author Affiliations

Applied Optics, Vol. 39, Issue 31, pp. 5750-5754 (2000)

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The polarimetric interference pattern on the surface of single-mode planar waveguides made by potassium ion exchange in soda-lime glass substrates can be observed through a 45° analyzer, which allows for the high-precision measurement of the modal birefringence of samples in a wide range of 0 to 5 × 10-4. Using this method, believed to be new, we investigated the effects of exchange temperature and time on the modal birefringence of single-mode potassium ion-exchanged waveguides. The modal birefringence profile was achieved by measurement of the variation of the phase difference between the TE0 and the TM0 modes with hydrofluoric-acid-etching depth of the sample.

© 2000 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(160.2750) Materials : Glass and other amorphous materials
(190.4350) Nonlinear optics : Nonlinear optics at surfaces
(190.5330) Nonlinear optics : Photorefractive optics
(230.7390) Optical devices : Waveguides, planar

Original Manuscript: June 2, 2000
Published: November 1, 2000

Zhi-mei Qi, Kiminori Itoh, and Masayuki Murabayashi, "Measurement of the modal birefringence of single-mode K+ ion-exchanged planar waveguides with polarimetric interferometry," Appl. Opt. 39, 5750-5754 (2000)

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