We have directly measured the retardance versus temperature for single-crystal quartz (SiO2) and magnesium fluoride (MgF2) at wavelengths of 633, 788, 1318, and 1539 nm and over a temperature range of 24–80 °C. To our knowledge, the temperature dependence of retardance for these two materials has not been directly measured. We compared our direct measurements of the normalized temperature derivative of the retardance γ with derived values from previously reported indirect measurements and found our results to be in agreement and our measurement uncertainties to be typically a factor of 4 smaller. Our overall mean value for γSiO2 is -1.23 × 10-4 with a combined standard uncertainty of 0.02 × 10-4 and little wavelength dependence over the 633–1539-nm range. Our overall mean value for γMgF2 is -5.37 × 10-5 with a combined standard uncertainty of 0.17 × 10-5 and with a small wavelength dependence over the 633–1539-nm range.
© 2000 Optical Society of America
Original Manuscript: April 17, 2000
Revised Manuscript: July 11, 2000
Published: November 1, 2000
Shelley M. Etzel, A. H. Rose, and C. M. Wang, "Dispersion of the temperature dependence of the retardance in SiO2 and MgF2," Appl. Opt. 39, 5796-5800 (2000)