Analysis of Reflectometers for Surface Anisotropy
Applied Optics, Vol. 39, Issue 31, pp. 5820-5826 (2000)
http://dx.doi.org/10.1364/AO.39.005820
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Abstract
A succinct analysis of normal-incidence reflectometers for surface anisotropy, based on the Jones-matrix formalism, is performed. In particular, two relevant configurations with and without analyzers are compared and discussed. The latter is found to be more user friendly than the former, since most errors vanish to the first order of approximation. Therefore the optical alignment is greatly simplified. On the other hand, this configuration does not yield complete physical information. We discuss how this drawback can be circumvented in surface studies by use of the three-layer model and a Kramers–Kronig analysis.
© 2000 Optical Society of America
[Optical Society of America ]
OCIS Codes
(120.5700) Instrumentation, measurement, and metrology : Reflection
(230.1040) Optical devices : Acousto-optical devices
(230.4110) Optical devices : Modulators
(240.0240) Optics at surfaces : Optics at surfaces
(260.1440) Physical optics : Birefringence
(300.6470) Spectroscopy : Spectroscopy, semiconductors
Citation
Antonio Salvati and Piero Chiaradia, "Analysis of Reflectometers for Surface Anisotropy," Appl. Opt. 39, 5820-5826 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-31-5820
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