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Applied Optics

Applied Optics


  • Vol. 39, Iss. 31 — Nov. 1, 2000
  • pp: 5820–5826

Analysis of reflectometers for surface anisotropy

Antonio Salvati and Piero Chiaradia  »View Author Affiliations

Applied Optics, Vol. 39, Issue 31, pp. 5820-5826 (2000)

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A succinct analysis of normal-incidence reflectometers for surface anisotropy, based on the Jones-matrix formalism, is performed. In particular, two relevant configurations with and without analyzers are compared and discussed. The latter is found to be more user friendly than the former, since most errors vanish to the first order of approximation. Therefore the optical alignment is greatly simplified. On the other hand, this configuration does not yield complete physical information. We discuss how this drawback can be circumvented in surface studies by use of the three-layer model and a Kramers–Kronig analysis.

© 2000 Optical Society of America

OCIS Codes
(120.5700) Instrumentation, measurement, and metrology : Reflection
(230.1040) Optical devices : Acousto-optical devices
(230.4110) Optical devices : Modulators
(240.0240) Optics at surfaces : Optics at surfaces
(260.1440) Physical optics : Birefringence
(300.6470) Spectroscopy : Spectroscopy, semiconductors

Original Manuscript: March 31, 2000
Revised Manuscript: June 22, 2000
Published: November 1, 2000

Antonio Salvati and Piero Chiaradia, "Analysis of reflectometers for surface anisotropy," Appl. Opt. 39, 5820-5826 (2000)

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