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Applied Optics

Applied Optics


  • Vol. 39, Iss. 31 — Nov. 1, 2000
  • pp: 5834–5842

Thermal emission from dielectric beam splitters in Michelson interferometers: a schematic analysis

Olaf Trieschmann and Christian Weddigen  »View Author Affiliations

Applied Optics, Vol. 39, Issue 31, pp. 5834-5842 (2000)

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Thermal emission from beam splitters in Fourier transform infrared spectrometers causes spectral amplitudes that are in quadrature to those of radiation from the field of view or from the detector port. Beam-splitter emission is described as a superposition of radiation of electromagnetic dipoles with angular polarization correlation taken into account for the real refractive index. Surface emission shows characteristic differences compared with volume emission. Numerical data are given for experimental conditions adapted to those of the airborne limb sounder MIPAS-FT.

© 2000 Optical Society of America

OCIS Codes
(230.1360) Optical devices : Beam splitters
(260.3160) Physical optics : Interference
(300.2140) Spectroscopy : Emission
(300.6300) Spectroscopy : Spectroscopy, Fourier transforms
(300.6340) Spectroscopy : Spectroscopy, infrared
(350.2460) Other areas of optics : Filters, interference

Original Manuscript: April 10, 2000
Revised Manuscript: August 14, 2000
Published: November 1, 2000

Olaf Trieschmann and Christian Weddigen, "Thermal emission from dielectric beam splitters in Michelson interferometers: a schematic analysis," Appl. Opt. 39, 5834-5842 (2000)

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