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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 39, Iss. 33 — Nov. 20, 2000
  • pp: 6193–6196

Measurement of refractive nonlinearities in GaAs above bandgap energy

Marcelo Martinelli, Laércio Gomes, and Ricardo J. Horowicz  »View Author Affiliations


Applied Optics, Vol. 39, Issue 33, pp. 6193-6196 (2000)
http://dx.doi.org/10.1364/AO.39.006193


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Abstract

We present a technique for single-beam measurement of the optical nonlinearity in GaAs for photon energies above the bandgap. We measured the real and the imaginary parts of the nonlinear refractive index of a bulk crystal by using the change in reflection of dye laser pulses (10 ns, 538 nm). The values obtained, n2 = (7.8 ± 0.6) × 10-8 cm2/W and κ2 = (-2.8 ± 0.7) × 10-8 cm2/W, are discussed.

© 2000 Optical Society of America

OCIS Codes
(190.3270) Nonlinear optics : Kerr effect
(190.4350) Nonlinear optics : Nonlinear optics at surfaces

History
Original Manuscript: January 18, 2000
Revised Manuscript: July 31, 2000
Published: November 20, 2000

Citation
Marcelo Martinelli, Laércio Gomes, and Ricardo J. Horowicz, "Measurement of refractive nonlinearities in GaAs above bandgap energy," Appl. Opt. 39, 6193-6196 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-33-6193

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