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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 39, Iss. 33 — Nov. 20, 2000
  • pp: 6193–6196

Measurement of Refractive Nonlinearities in GaAs Above Bandgap Energy

Marcelo Martinelli, Laércio Gomes, and Ricardo J. Horowicz  »View Author Affiliations


Applied Optics, Vol. 39, Issue 33, pp. 6193-6196 (2000)
http://dx.doi.org/10.1364/AO.39.006193


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Abstract

We present a technique for single-beam measurement of the optical nonlinearity in GaAs for photon energies above the bandgap. We measured the real and the imaginary parts of the nonlinear refractive index of a bulk crystal by using the change in reflection of dye laser pulses (10 ns, 538 nm). The values obtained, <i>n</i><sub>2</sub> = (7.8 ∓ 0.6) × 10<sup>−8</sup> cm<sup>2</sup>/W and κ<sub>2</sub> = (−2.8 ∓ 0.7) × 10<sup>−8</sup> cm<sup>2</sup>/W, are discussed.

© 2000 Optical Society of America

OCIS Codes
(190.3270) Nonlinear optics : Kerr effect
(190.4350) Nonlinear optics : Nonlinear optics at surfaces

Citation
Marcelo Martinelli, Laércio Gomes, and Ricardo J. Horowicz, "Measurement of Refractive Nonlinearities in GaAs Above Bandgap Energy," Appl. Opt. 39, 6193-6196 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-33-6193


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References

  1. U. Keller, “Semiconductor nonlinearities for solid-state laser modelocking and Q-switching,” in Nonlinear Optics in Semiconductors II, E. Garmire and A. Kost, eds., Vol. 59 of Semiconductors and Semimetals (Academic, San Diego, Calif., 1999).
  2. F. Henneberger, S. Schmitt-Rink, and E. O. Gobel, eds., Optics of Semiconductor Nanostructures (Akademie-Verlag, Berlin, 1993).
  3. M. Sheik-Bahae, D. C. Hutchings, D. J. Hagan, and E. W. Van Stryland, “Dispersion of bound electronic nonlinear refraction in solids,” IEEE J. Quantum Electron. 27, 1296–1309 (1991).
  4. H.-C. Lee, A. Kost, M. Kawase, A. Hariz, P. D. Dapkus, and E. M. Garmire, “Nonlinear absorption properties of AlGaAs/GaAs multiple quantum wells grown by metalorganic chemical vapor-deposition,” IEEE J. Quantum Electron. 24, 1581–1592 (1988).
  5. M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26, 760–769 (1990).
  6. N. Peyghambarian and S. W. Koch, “Semiconductor nonlinear materials,” in Nonlinear Photonics, H. M. Gibbs, G. Khitrova, and N. Peyghambarian, eds. (Springer-Verlag, Berlin, 1990), Chap. 2.
  7. Y. H. Lee, A. Chavez-Pirson, S. W. Koch, H. M. Gibbs, S. H. Park, J. Morhange, A. Jeffery, N. Peyghambarian, L. Banyai, A. C. Gossard, and W. Wiegmann, “Room-temperature optical nonlinearities in GaAs,” Phys. Rev. Lett. 57, 2446–2449 (1986).
  8. D. V. Petrov, A. S. L. Gomes, and C. B. de Araújo, “Reflection Z-scan technique for measurements of optical properties of surfaces,” Appl. Phys. Lett. 65, 1067–1069 (1994).
  9. D. V. Petrov, A. S. L. Gomes, and C. B. de Araújo, “Reflection of a Gaussian beam from a saturable absorber,” Opt. Commun. 123, 637–641 (1996).
  10. B. O. Seraphin and H. E. Bennett, “Optical constants,” in Optical Properties of III–V Compounds, R. K. Willardson and A. C. Beer, eds., Vol. 3 of Semiconductors and Semimetals (Academic, New York, 1962), Chap. 12.
  11. M. Martinelli, S. Bian, J. R. Leite, and R. J. Horowicz, “Sensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam,” Appl. Phys. Lett. 72, 1427–1429 (1998).
  12. M. Born and E. Wolf, Principles of Optics (Pergamon, New York, 1959).
  13. W. Zhao and P. Palffy-Muhoray, “Z-scan technique using top-hat beams,” Appl. Phys. Lett. 63, 1613–1615 (1993).
  14. P. Palffy-Muhoray, H. J. Yuan, L. Li, M. A. Lee, J. R. DeSalvo, T. H. Wei, M. Sheik-Bahae, D. J. Hagan, and E. W. Van Stryland, “Measurements of third-order optical nonlinearities of nematic liquid crystals,” Mol. Cryst. Liq. Cryst. 207, 291–305 (1991).
  15. M. Gershenzon, “Radiative recombination in the III–V compounds,” in Physics of III–V Compounds, R. K. Willardson and A. C. Beer, eds., Vol. 2 of Semiconductors and Semimetals (Academic, New York, 1962), Chap. 13.
  16. M. A. Olmstead, N. M. Amer, and S. Kohn, “Photothermal displacement spectroscopy: an optical probe for solids and surfaces,” Appl. Phys. A 32, 141–154 (1983).

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