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Applied Optics

Applied Optics


  • Vol. 39, Iss. 34 — Dec. 1, 2000
  • pp: 6369–6373

Three-dimensional imaging analysis of confocal and conventional polarization microscopes by use of Mie scattering theory

Wataru Inami and Yoshimasa Kawata  »View Author Affiliations

Applied Optics, Vol. 39, Issue 34, pp. 6369-6373 (2000)

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We present a three-dimensional imaging analysis of confocal and conventional polarization microscopes by using the extended Mie scattering theory. In the analysis, we calculate the images of a Mie particle whose diameter is comparable with the wavelength of confocal and conventional microscopes. It was found that, when we observe a Mie particle, polarization confocal microscopy is not affected by the polarization distortion that is due to focusing with high-numerical-aperture lenses and does not produce pseudopeaks in the images in comparison with conventional polarization microscopy. The three-dimensional resolution of the polarization microscope and the verification of the proposed analysis method are also discussed.

© 2000 Optical Society of America

OCIS Codes
(050.1960) Diffraction and gratings : Diffraction theory
(110.0180) Imaging systems : Microscopy
(110.6880) Imaging systems : Three-dimensional image acquisition
(290.4020) Scattering : Mie theory

Original Manuscript: April 24, 2000
Revised Manuscript: August 10, 2000
Published: December 1, 2000

Wataru Inami and Yoshimasa Kawata, "Three-dimensional imaging analysis of confocal and conventional polarization microscopes by use of Mie scattering theory," Appl. Opt. 39, 6369-6373 (2000)

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