We present a three-dimensional imaging analysis of confocal and conventional polarization microscopes by using the extended Mie scattering theory. In the analysis, we calculate the images of a Mie particle whose diameter is comparable with the wavelength of confocal and conventional microscopes. It was found that, when we observe a Mie particle, polarization confocal microscopy is not affected by the polarization distortion that is due to focusing with high-numerical-aperture lenses and does not produce pseudopeaks in the images in comparison with conventional polarization microscopy. The three-dimensional resolution of the polarization microscope and the verification of the proposed analysis method are also discussed.
© 2000 Optical Society of America
[Optical Society of America ]
(050.1960) Diffraction and gratings : Diffraction theory
(110.0180) Imaging systems : Microscopy
(110.6880) Imaging systems : Three-dimensional image acquisition
(290.4020) Scattering : Mie theory
Wataru Inami and Yoshimasa Kawata, "Three-Dimensional Imaging Analysis of Confocal and Conventional Polarization Microscopes By Use of Mie Scattering Theory," Appl. Opt. 39, 6369-6373 (2000)