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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 39, Iss. 34 — Dec. 1, 2000
  • pp: 6430–6435

Application of a liquid-crystal spatial light modulator for brightness adaptation in microscopic topometry

Klaus-Peter Proll, Jean-Marc Nivet, Christoph Voland, and Hans J. Tiziani  »View Author Affiliations


Applied Optics, Vol. 39, Issue 34, pp. 6430-6435 (2000)
http://dx.doi.org/10.1364/AO.39.006430


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Abstract

Three-dimensional optical topometry of technical surfaces becomes increasingly important for the control of industrial processes. However, the local reflectance of the surface of the investigated sample often varies within a wide range, making accurate measurements by fringe projection difficult. We demonstrate the use of a liquid-crystal spatial light modulator as the fringe-generating element in a standard stereo microscope. With this device the brightness of the projected patterns can be adapted pixelwise. This technique leads to a significant improvement of the results of our measurements with a phase-shifting algorithm.

© 2000 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3940) Instrumentation, measurement, and metrology : Metrology
(180.6900) Microscopy : Three-dimensional microscopy

Citation
Klaus-Peter Proll, Jean-Marc Nivet, Christoph Voland, and Hans J. Tiziani, "Application of a liquid-crystal spatial light modulator for brightness adaptation in microscopic topometry," Appl. Opt. 39, 6430-6435 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-34-6430


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References

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