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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 39, Iss. 4 — Feb. 1, 2000
  • pp: 539–545

Optical technique for the automatic detection and measurement of surface defects on thin metallic wires

Luis Miguel Sanchez-Brea, Philip Siegmann, Maria Aurora Rebollo, and Eusebio Bernabeu  »View Author Affiliations


Applied Optics, Vol. 39, Issue 4, pp. 539-545 (2000)
http://dx.doi.org/10.1364/AO.39.000539


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Abstract

In industrial applications of thin metallic wires it is important to characterize the surface defects of the wires. We present an optical technique for the automatic detection of surface defects on thin metallic wires (diameters, 50–2000 µm) that can be used in on-line systems for surface quality control. This technique is based on the intensity variations on the scattered cone generated when the wire is illuminated with a beam at oblique incidence. Our results are compared with those obtained by atomic-force microscopy and scanning-electron microscopy.

© 2000 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.6660) Instrumentation, measurement, and metrology : Surface measurements, roughness
(240.0240) Optics at surfaces : Optics at surfaces
(240.5770) Optics at surfaces : Roughness
(240.6700) Optics at surfaces : Surfaces

History
Original Manuscript: May 26, 1999
Revised Manuscript: October 7, 1999
Published: February 1, 2000

Citation
Luis Miguel Sanchez-Brea, Philip Siegmann, Maria Aurora Rebollo, and Eusebio Bernabeu, "Optical technique for the automatic detection and measurement of surface defects on thin metallic wires," Appl. Opt. 39, 539-545 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-4-539

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