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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 39, Iss. 7 — Mar. 1, 2000
  • pp: 1174–1182

Improved Method for Determination of Optical Constants of Organic Thin Films from Reflection and Transmission Measurements

Aleksandra B. DjurišiĆ, Torsten Fritz, Karl Leo, and E. Herbert Li  »View Author Affiliations


Applied Optics, Vol. 39, Issue 7, pp. 1174-1182 (2000)
http://dx.doi.org/10.1364/AO.39.001174


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Abstract

A new technique for determining the optical properties of organic thin films is presented. A detailed evaluation of the accuracy of the determined optical constants has been performed, and the best combination of measured values yielding the smallest errors in the index of refraction for realistic experimental uncertainties has been found. The proposed method utilizes the fact that optical constants are smooth continuous functions, which reduces the possibility of encountering multiple solutions. The method consists of two steps. In the first step the optical constants at all wavelengths and the film thickness are determined. In the second step the thickness and the imaginary part of the index of refraction are kept fixed while we reevaluate the real part of the index of refraction by using a different objective function with improved sensitivity to the refractive index. After verifying that the proposed method is capable of an accurate estimation of optical constants, we determine the index of refraction data of vanadyl-phthalocyanine in the visible spectral range.

© 2000 Optical Society of America

OCIS Codes
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(120.5700) Instrumentation, measurement, and metrology : Reflection
(120.7000) Instrumentation, measurement, and metrology : Transmission
(160.4890) Materials : Organic materials

Citation
Aleksandra B. DjurišiĆ, Torsten Fritz, Karl Leo, and E. Herbert Li, "Improved Method for Determination of Optical Constants of Organic Thin Films from Reflection and Transmission Measurements," Appl. Opt. 39, 1174-1182 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-7-1174


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