Abstract
A reflectometer using linearly polarized incident radiation is described which permits the measurement of the ratio R = R||/R⊥ as a function of the angle of incidence including that corresponding to the pseudo-Brewster angle. Special features are: (1) that the source and detector are mounted in fixed positions; (2) the reflectometer can be mounted in a cryogenic apparatus. It is shown that the resulting data can be reduced to give the pseudo-Brewster angle φB (or the quantity XB2 = sin2φB tan2φB) with precision, and the minimum value of R at φB (RB). With these two parameters, the optical constants for a specular sample that can be characterized as having a complex dielectric constant, ∊ = ∊1 + i∊2, can be determined in an analytical manner.
© 1965 Optical Society of America
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