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Far Infrared Reflectometer for Imperfectly Diffuse Specimens

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Abstract

Apparatus for measurement of spectral directional reflectance in the far infrared between 2–100 μ is described. The reflectometer consists of opposed paraboloids, one on axis with 90° lip angle and a second of longer focal length off axis. A large uniform source beyond a chopper and the focal point of the off-axis paraboloid provides diffuse irradiation onto the sample. Spectral reflectances of diffusing and specular materials measured with the reflectometer attached to prism and grating monochromators are reported. Performance data including stray energy measurements are given, and results of an error analysis are presented.

© 1965 Optical Society of America

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