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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 4, Iss. 8 — Aug. 1, 1965
  • pp: 891–898

Thin Films and Their Uses for the Extreme Ultraviolet

W. R. Hunter, D. W. Angel, and R. Tousey  »View Author Affiliations


Applied Optics, Vol. 4, Issue 8, pp. 891-898 (1965)
http://dx.doi.org/10.1364/AO.4.000891


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Abstract

The transmittance characteristics in the extreme ultraviolet of unbacked films are discussed; data are presented for films of Al, In, Bi, Ge, Si, and certain organic materials. Generally, the metals begin to transmit shortward of their critical wavelengths, determined by the electron eigenloss, and reach maximum transparency at the nearest x-ray edge; to shorter wavelengths regions of transparency exist between the other x-ray edges. Their use in order-sorting, and for eliminating long-wavelength stray light, is illustrated with laboratory spectra and solar spectra obtained from rockets.

© 1965 Optical Society of America

History
Original Manuscript: April 26, 1965
Published: August 1, 1965

Citation
W. R. Hunter, D. W. Angel, and R. Tousey, "Thin Films and Their Uses for the Extreme Ultraviolet," Appl. Opt. 4, 891-898 (1965)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-4-8-891


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