Abstract

The transmittance characteristics in the extreme ultraviolet of unbacked films are discussed; data are presented for films of Al, In, Bi, Ge, Si, and certain organic materials. Generally, the metals begin to transmit shortward of their critical wavelengths, determined by the electron eigenloss, and reach maximum transparency at the nearest x-ray edge; to shorter wavelengths regions of transparency exist between the other x-ray edges. Their use in order-sorting, and for eliminating long-wavelength stray light, is illustrated with laboratory spectra and solar spectra obtained from rockets.

© 1965 Optical Society of America

A Carbon Film-Scintillator Combination Suitable for the Selective Detection of Radiation in the Extreme Ultraviolet

James A. R. Samson and R. B. Cairns
Appl. Opt. 4(8) 915-916 (1965)

Transmittance of Thin Metallic Films in the Vacuum-Ultraviolet Region Below 1000 Å

Om P. Rustgi
J. Opt. Soc. Am. 55(6) 630-634 (1965)

Long-term changes in Al thin-film extreme ultraviolet filters

Jiri Schmidt, Karel Kolacek, Alexandr Frolov, Jaroslav Straus, Petr Hoffer, Vitaliy Stelmashuk, Andrii Tuholukov, Petr Jiricek, and Jana Houdkova
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Effect of Ultraviolet Irradiation on the Optical Properties of Silicon Oxide Films

A. P. Bradford, G. Hass, M. McFarland, and E. Ritter
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Thin aluminum filters for use on the Apollo Telescope Mount XUV spectrographs

R. J. Schumacher and W. R. Hunter
Appl. Opt. 16(4) 904-908 (1977)