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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 40, Iss. 1 — Jan. 1, 2001
  • pp: 100–103

Highly sensitive pulsed digital holography for built-in defect analysis with a laser excitation

Staffan Schedin, Giancarlo Pedrini, Hans J. Tiziani, Anil K. Aggarwal, and Mikhail E. Gusev  »View Author Affiliations


Applied Optics, Vol. 40, Issue 1, pp. 100-103 (2001)
http://dx.doi.org/10.1364/AO.40.000100


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Abstract

A highly sensitive method is presented for noninvasive defect analysis on thin structures with a Q-switched double-pulsed ruby laser with frequency doubling (347 nm). In our research we feature an all-optical arrangement, where a focused laser pulse derived from the same ruby laser (694 nm) acts as a built-in synchronous excitation source for digital holographic interferometry. The recordings are made with a CCD camera for capturing two holograms (two states of the specimen) corresponding to the two UV laser pulses with a short time separation (10–50 µs). Subtraction of the phase distribution in two digital holograms gives a fringe phase map that shows the change in deformation of the specimen between the recordings. The advantage of the proposed method is two fold. First, the use of a shorter wavelength results in a higher sensitivity. Second, owing to the induced synchronous built-in optical excitation, the specimen is not subjected to any external physical excitation devices. Experimental results are presented on identification and evaluation of defects in thin metal sheets.

© 2001 Optical Society of America

OCIS Codes
(090.2880) Holography : Holographic interferometry
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(140.3540) Lasers and laser optics : Lasers, Q-switched

History
Original Manuscript: April 27, 2000
Revised Manuscript: August 29, 2000
Published: January 1, 2001

Citation
Staffan Schedin, Giancarlo Pedrini, Hans J. Tiziani, Anil K. Aggarwal, and Mikhail E. Gusev, "Highly sensitive pulsed digital holography for built-in defect analysis with a laser excitation," Appl. Opt. 40, 100-103 (2001)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-40-1-100

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