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Applied Optics

Applied Optics


  • Vol. 40, Iss. 1 — Jan. 1, 2001
  • pp: 52–61

Full-field automated photoelasticity by Fourier polarimetry with three wavelengths

Svitlana Berezhna, Ihor Berezhnyy, Masahisa Takashi, and Arkady Voloshin  »View Author Affiliations

Applied Optics, Vol. 40, Issue 1, pp. 52-61 (2001)

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The search for fast, precise, and robust testing techniques remains an important problem in automated full-field photoelasticity. The polarizer–sample–analyzer (PSA)–based three-wavelength polarimetric method presented here employs discrete Fourier analysis and a spectral content unwrapping algorithm to provide completely automatic, simple, fast, and accurate determination of both photoelastic parameters. Fourier analysis of experimental data and a three-wavelength approach reduce the effect of noise and efficiently cope with poor accuracy in regions of both isochromatic and isoclinic maps. Because any polarimetric technique yields the phase value in the principal range of the corresponding trigonometric function, the final step in data processing is phase unwrapping. Because of the good quality of the wrapped phase map and because each point is processed independently, our suggested three-wavelength unwrapping algorithm exhibits a high level of robustness. Unlike some other PSA three-wavelength techniques, the given algorithm here solves the problem of phase unwrapping completely. Specifically, it converts experimentally obtained arccosine-type phase maps directly into full phase value distributions, skipping the step of generating an arctangent-type ramped phase map and resorting to other unwrapping routines for final data processing. The accuracy of the new technique has been estimated with a Babinet–Soleil compensator. Test experiments with the disk in diametric compression and a quartz plate have proved that the technique can be used for precise determination of the isoclinic angle and relative retardation, even for large values of the latter.

© 2001 Optical Society of America

OCIS Codes
(100.2000) Image processing : Digital image processing
(100.2650) Image processing : Fringe analysis
(100.5070) Image processing : Phase retrieval
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(260.1440) Physical optics : Birefringence
(350.4600) Other areas of optics : Optical engineering

Original Manuscript: June 13, 2000
Published: January 1, 2001

Svitlana Berezhna, Ihor Berezhnyy, Masahisa Takashi, and Arkady Voloshin, "Full-field automated photoelasticity by Fourier polarimetry with three wavelengths," Appl. Opt. 40, 52-61 (2001)

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  1. R. K. Muller, L. R. Saackel, “Complete automatic analysis of photoelastic fringes,” Exp. Mech. 18, 245–251 (1979). [CrossRef]
  2. A. S. Voloshin, A. S. Redner, “Automated measurement of birefringence: development and experimental evaluation of the technique,” Exp. Mech. 28, 252–257 (1989). [CrossRef]
  3. E. A. Patterson, Z. F. Wang, “Towards full-field automatic photoelastic analysis of complex components,” Strain 27, 49–56 (1991). [CrossRef]
  4. A. V. S. S. R. Sarma, S. A. Pillai, G. Subramanian, T. K. Varadan, “Computerized image processing for whole-field determination of isoclinics and isochromatics,” Exp. Mech. 31, 24–29 (1992). [CrossRef]
  5. Y. Morimoto, M. Fujisawa, “Fringe pattern analysis by a phase-shifting method using Fourier transform,” Opt. Eng. 33, 3709–3714 (1994). [CrossRef]
  6. A. Ajovalasit, S. Barone, G. Petrucci, “Towards RGB photoelasticity: full-field automated photoelasticity in white light,” Exp. Mech. 35, 193–200 (1995). [CrossRef]
  7. C. Buckberry, D. Towers, “New approaches to the full-field analysis of photoelastic stress patterns,” Opt. Lasers Eng. 24, 415–428 (1996). [CrossRef]
  8. J. A. Quiroga, A. Gonzalez-Cano, “Phase measuring algorithm for extraction of isochromatic of photoelastic fringe patterns,” Appl. Opt. 36, 8397–8402 (1997). [CrossRef]
  9. T. W. Ng, “Derivation of retardation phase in computer-aided photoelasticity by using carrier fringe phase shifting,” Appl. Opt. 36, 8259–8263 (1997). [CrossRef]
  10. A. D. Nurse, “Full-field automated photoelasticity by use of a three-wavelength approach to phase stepping,” Appl. Opt. 36, 5781–5786 (1997). [CrossRef] [PubMed]
  11. M. N. Pacey, X. Z. Wang, S. J. Haake, E. A. Patterson, “The application of evolutionary and maximum entropy algorithms to photoelastic spectral analysis,” Exp. Mech. 39, 265–274 (1999). [CrossRef]
  12. N. Plouzennec, A. Lagarde, “Two-wavelength method for full-field automated photoelasticity,” Exp. Mech. 39, 274–278 (1999). [CrossRef]
  13. A. Asundi, L. Tong, Ch. G. Boay, “Phase shifting method with a normal polariscope,” Appl. Opt. 38, 5931–5935 (1999). [CrossRef]
  14. J. M. Huntley, “Noise-immune phase unwrapping algorithm,” Appl. Opt. 28, 3268–3270 (1989). [CrossRef] [PubMed]
  15. R. M. A. Azzam, “Photopolarimetric measurement of the Mueller matrix by Fourier analysis of a single detected signal,” Opt. Lett. 2, 148–150 (1978). [CrossRef] [PubMed]
  16. R. M. A. Azzam, “A simple Fourier photopolarimeter with rotating polarizer and analyzer for measuring Jones and Mueller matrices,” Opt. Commun. 25, 137–140 (1978). [CrossRef]
  17. D. H. Goldstein, “Mueller matrix dual-rotating retarder polarimeter,” Appl. Opt. 31, 6676–6683 (1992). [CrossRef] [PubMed]
  18. J. L. Pezanniti, R. A. Chipman, “Mueller matrix imaging polarimetry,” Opt. Eng. 34, 1558–1568 (1995). [CrossRef]
  19. R. W. Collins, J. Koh, “Dual rotating-compensator multichannel ellipsometer: instrument design for real-time Mueller matrix spectroscopy of surfaces and films,” J. Opt. Soc. Am. A 16, 1997–2006 (1999). [CrossRef]
  20. S. Yu Berezhna, I. V. Berezhnyy, M. Takashi, “Photoelastic analysis through Jones matrix imaging Fourier polarimetry,” in Proceedings of the International Conference on Advanced Technology in Experimental Mechanics ’99 (Japan Society of Mechanical Engineering, Tokyo, 1999), Vol. 2, pp. 635–640.
  21. A. S. Kobayashi, ed., Handbook on Experimental Mechanics (Society for Experimental Mechanics, Bethel, Conn.1993).
  22. I. K. Kikoin, Tables of Physical Parameters (Atomizdat, Moscow, 1967).

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