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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 40, Iss. 10 — Apr. 1, 2001
  • pp: 1617–1622

Total internal reflection for precision small-angle measurement

Aiyu Zhang and Peisen S. Huang  »View Author Affiliations


Applied Optics, Vol. 40, Issue 10, pp. 1617-1622 (2001)
http://dx.doi.org/10.1364/AO.40.001617


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Abstract

A method for precision small-angle measurement is proposed. This method is based on the total-internal-reflection effect of a light beam at a pair of glass prisms. Angular displacement of the light beam is measured when the intensity change of the reflected beam is detected as a result of the relative phase shift between the s- and the p-polarized beams. An initial phase shift between the s- and the p-polarized components is introduced to increase measurement sensitivity. For increased measurement linearity and reduced effect of laser power fluctuation on the output, a differential method is used in which the light beam is split equally into two beams, each reflected at a prism and detected by a photodiode. The output is obtained as the difference of the two detected intensities divided by their sum. A prototype device was built, which demonstrated a nonlinearity error of 1.3% in a measurement range of ±0.6° or 0.4% in ±0.3°. The peak-to-peak noise level was found to be at approximately 0.5 arc sec. This noise level can be reduced further and resolution increased by a reduction of the measurement range.

© 2001 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.5700) Instrumentation, measurement, and metrology : Reflection
(260.3160) Physical optics : Interference
(260.5430) Physical optics : Polarization
(260.6970) Physical optics : Total internal reflection

History
Original Manuscript: August 14, 2000
Revised Manuscript: December 7, 2000
Published: April 1, 2001

Citation
Aiyu Zhang and Peisen S. Huang, "Total internal reflection for precision small-angle measurement," Appl. Opt. 40, 1617-1622 (2001)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-40-10-1617


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References

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