OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 40, Iss. 10 — Apr. 1, 2001
  • pp: 1631–1636

Two-beam interferometer for measuring aberrations of optical components with axial symmetry

Sergio De Nicola, Pietro Ferraro, Andrea Finizio, and Giovanni Pierattini  »View Author Affiliations


Applied Optics, Vol. 40, Issue 10, pp. 1631-1636 (2001)
http://dx.doi.org/10.1364/AO.40.001631


View Full Text Article

Enhanced HTML    Acrobat PDF (2211 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

We present a concept of interferometric testing, believed to be novel, that can be applied to measuring aberrations of optical components that have rotational symmetry. The optical configuration uses two coherent, collimated wave fronts that are tilted to impinge upon the optical component being tested such that one beam is on axis and the other is off axis. For small tilt angles the two aberrated wave fronts can be considered to be carrying the same aberrations. Furthermore, the off-axis beam is displaced along a direction orthogonal to the optical axis of the component. Interference between the two aberrated wave fronts produces a fringe pattern that is similar to a lateral shear interference pattern. Moiré fringes are obtained by spatial beating of the interference pattern with a CCD TV camera array. Under such conditions it is possible to subtract most of the linear carrier that is intrinsically present in the resultant fringe pattern owing to the large defocus aberration and tilt.

© 2001 Optical Society of America

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.4120) Instrumentation, measurement, and metrology : Moire' techniques
(220.4840) Optical design and fabrication : Testing

History
Original Manuscript: March 31, 2000
Revised Manuscript: July 27, 2000
Published: April 1, 2001

Citation
Sergio De Nicola, Pietro Ferraro, Andrea Finizio, and Giovanni Pierattini, "Two-beam interferometer for measuring aberrations of optical components with axial symmetry," Appl. Opt. 40, 1631-1636 (2001)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-40-10-1631

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited