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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 40, Iss. 10 — Apr. 1, 2001
  • pp: 1631–1636

Two-Beam Interferometer for Measuring Aberrations of Optical Components with Axial Symmetry

Sergio De Nicola, Pietro Ferraro, Andrea Finizio, and Giovanni Pierattini  »View Author Affiliations


Applied Optics, Vol. 40, Issue 10, pp. 1631-1636 (2001)
http://dx.doi.org/10.1364/AO.40.001631


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Abstract

We present a concept of interferometric testing, believed to be novel, that can be applied to measuring aberrations of optical components that have rotational symmetry. The optical configuration uses two coherent, collimated wave fronts that are tilted to impinge upon the optical component being tested such that one beam is on axis and the other is off axis. For small tilt angles the two aberrated wave fronts can be considered to be carrying the same aberrations. Furthermore, the off-axis beam is displaced along a direction orthogonal to the optical axis of the component. Interference between the two aberrated wave fronts produces a fringe pattern that is similar to a lateral shear interference pattern. Moiré fringes are obtained by spatial beating of the interference pattern with a CCD TV camera array. Under such conditions it is possible to subtract most of the linear carrier that is intrinsically present in the resultant fringe pattern owing to the large defocus aberration and tilt.

© 2001 Optical Society of America

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.4120) Instrumentation, measurement, and metrology : Moire' techniques
(220.4840) Optical design and fabrication : Testing

Citation
Sergio De Nicola, Pietro Ferraro, Andrea Finizio, and Giovanni Pierattini, "Two-Beam Interferometer for Measuring Aberrations of Optical Components with Axial Symmetry," Appl. Opt. 40, 1631-1636 (2001)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-40-10-1631


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References

  1. G. W. R. Leibbrandt, G. Harbers, and P. J. Kunst, “Wave-front analysis with high accuracy by use of a double-grating lateral shearing interferometer,” Appl. Opt. 35, 6151–6161 (1996).
  2. H. Nomura and T. Sato, “Techniques for measuring aberrations in lenses used in photolithography with printed pattern,” Appl. Opt. 38, 2800–2807 (1999).
  3. R. S. Sirohi, T. Eiju, and T. H. Barnes, “Multiple-beam lateral shear interferometry for optical testing,” Appl. Opt. 34, 2864–2870 (1995).
  4. D. Malacara, “Twyman–Green interferometer,” in Optical Shop Testing, 2nd ed., D. Malacara, ed. (Wiley, New York, 1992), Chap. 2.
  5. M. V. Mantravadi, “Lateral shearing interferometers,” in Optical Shop Testing, 2nd ed., D. Malacara, ed. (Wiley, New York, 1992), Chap. 4.
  6. D. Malacara, “Radial, rotational, and reversal shear interferometers,” in Optical Shop Testing, 2nd ed., D. Malacara, ed. (Wiley, New York, 1992), Chap. 5.
  7. M. Servin, D. Malacara, and J. L. Marroquin, “Wave-front recovery from two orthogonal sheared interferograms,” Appl. Opt. 35, 4343–4348 (1996).
  8. S. Loheide, “Innovative evaluation method for shearing interferograms,” Opt. Commun. 141, 254–258 (1997).
  9. A. Cornejo-Rodríguez, “Ronchi test,” in Optical Shop Testing, 2nd ed., D. Malacara, ed. (Wiley, New York, 1992), Chap. 9.
  10. K. Patorski, Handbook of the Moiré Fringe Technique (Elsevier, Amsterdam, 1993), Sec. 8.3.
  11. O. Kafri, “Noncoherent method for mapping phase objects,” Opt. Lett. 5, 555–557 (1980).
  12. S. Yokozeki and K. Ohnishi, “Spherical aberration measurement with shearing interferometer using Fourier imaging and moiré method,” Appl. Opt. 14, 623–627 (1975).
  13. M. Takeda and S. Kobayashi, “Lateral aberration measurements with a digital Talbot interferometer,” Appl. Opt. 23, 1760–1764 (1984).
  14. K. Patorski, “Talbot interferometry with increased shear: further considerations,” Appl. Opt. 25, 1111–1116 (1986).
  15. E. Keren, A. Livnat, and I. Glatt, “Moiré deflectometry with pure sinusoidal gratings,” Opt. Lett. 10, 167–169 (1985).
  16. J. C. Wyant, “Double frequency grating lateral shear interferometer,” Appl. Opt. 12, 2057–2061 (1973).
  17. P. Hariharan, W. H. Steel, and J. C. Wyant, “Double grating interferometer with variable lateral shear,” Opt. Commun. 11, 317–320 (1974).
  18. M. de Angelis, S. De Nicola, P. Ferraro, A. Finizio, and G. Pierattini, “A new approach to high accuracy measurement of the focal lengths of lenses using digital Fourier transform,” Opt. Commun. 136, 370–374 (1997).
  19. M. de Angelis, S. De Nicola, P. Ferraro, A. Finizio, and G. Pierattini, “An interferometric method for measuring short focal length refractive lenses and diffractive lenses,” Opt. Commun. 160, 5–9 (1999).
  20. M. V. Klain, Optics (Wiley, New York, 1970), pp. 142–145.
  21. B. W. Bell and C. L. Koliopoulos, “Moiré topography, sampling theory, and charge-coupled devices,” Opt. Lett. 9, 171–173 (1984).
  22. K. Engelhardt, “Acquisition of 3-D data by focus sensing utilizing the moiré effect of CCD cameras,” Appl. Opt. 30, 1401–1407 (1991).
  23. S. De Nicola and P. Ferraro, “A two-dimensional fast Fourier transform method for measuring inclination angle of parallel fringe pattern,” Opt. Laser Technol. 30, 167–173 (1998).
  24. P. Hariharan, B. F. Oreb, and T. Eiju, “Digital phase-shifting interferometry: a simple error-compensating phase calculation algorithm,” Appl. Opt. 26, 2504–2506 (1987).
  25. W. J. Smith, Modern Optical Engineering (McGraw-Hill, New York, 1966), Chap. 10, pp. 247–270.

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