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Applied Optics

Applied Optics


  • Vol. 40, Iss. 13 — May. 1, 2001
  • pp: 2159–2168

Measurements and predictions of light scattering by clear coatings

Mary E. McKnight, Theodore V. Vorburger, Egon Marx, Maria E. Nadal, P. Yvonne Barnes, and Michael A. Galler  »View Author Affiliations

Applied Optics, Vol. 40, Issue 13, pp. 2159-2168 (2001)

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Comparisons are made between calculated and measured angle-resolved light-scattering distributions from clear dielectric isotropic epoxy coatings over a range of rms roughness conditions, resulting in strongly specular scattering to diffuse scattering characteristics. Calculated distributions are derived from topography measurements performed with interferometric microscopes. Two methods of calculation are used. One determines the intensity of scattered light waves with a phase integral in the Kirchhoff approximation. The other is based on the reflection of light rays by locally flat surfaces. The angle-resolved scattering distributions for the coatings are measured with the spectral trifunction automated reference reflectometer (STARR) developed by the National Institute of Standards and Technology. Comparisons between measured and calculated results are shown for three surfaces with rms roughness values of approximately 3, 150, and 800 nm for an angle of incidence of 20°.

© 2001 Optical Society of America

OCIS Codes
(080.2720) Geometric optics : Mathematical methods (general)
(120.5700) Instrumentation, measurement, and metrology : Reflection
(120.6660) Instrumentation, measurement, and metrology : Surface measurements, roughness
(160.4890) Materials : Organic materials
(180.3170) Microscopy : Interference microscopy
(290.5880) Scattering : Scattering, rough surfaces

Original Manuscript: September 18, 2000
Revised Manuscript: February 9, 2001
Published: May 1, 2001

Mary E. McKnight, Theodore V. Vorburger, Egon Marx, Maria E. Nadal, P. Yvonne Barnes, and Michael A. Galler, "Measurements and predictions of light scattering by clear coatings," Appl. Opt. 40, 2159-2168 (2001)

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  1. M. Maynard, “Automakers’ color guard not spinning its wheels,” USA Today, 26October1998, p. 12B.
  2. M. E. McKnight, J. W. Martin, “Advanced methods and models for describing coating appearance,” Prog. Org. Coat. 34, 152–159 (1998). [CrossRef]
  3. P. Y. Barnes, E. A. Early, A. C. Parr, “Spectral reflectance,” NIST (Natl. Inst. Stand. Technol.) Spec.Publ. 250–48 (1998).
  4. P. Beckmann, A. Spizzichino, The Scattering of Electromagnetic Waves from Rough Surfaces (Pergamon, New York, 1963), p. 67 ff.
  5. R. Brodmann, M. Algäuer, “Comparison of light scattering from rough surfaces with optical and mechanical profilometry,” in Proceedings on Surface Measurement and Characterization, J. M. Bennett, ed., Proc. SPIE1009, 111–118 (1988). [CrossRef]
  6. J. T. Bendler, S. F. Feldman, H. Hatti, S. Y. Hobbs, “Approximate model of diffuse reflectance from rough polymer surfaces,” J. Appl. Phys. 83, 998–1004 (1998). [CrossRef]
  7. F. Y. Hunt, E. Marx, G. W. Meyer, T. V. Vorburger, P. A. Walker, H. B. Westlund, “A first step towards photorealistic rendering of coated surfaces and computer based standards of appearance,” in Service Life Methodology and Metrology, J. W. Martin, D. R. Bauer, eds., ACS Symposium Series (Oxford U. Press, New York, 2001). [CrossRef]
  8. Certain commercial equipment is identified in this paper to describe adequately an experimental procedure. Such identification does not imply that the equipment identified is necessarily the best available for the purpose nor does it imply any recommendation or endorsement by NIST.
  9. ASME Surface Quality Standard B46.1, Surface Texture (American Society of Mechanical Engineers, New York, 1995).
  10. D. B. Hall, P. Underhill, J. M. Torkelson, “Spin coating of thin and ultrathin polymer films,” Polym. Eng. Sci. 38, 2039–2045 (1998). [CrossRef]
  11. F. E. Nicodemus, J. C. Richmond, J. J. Hsia, I. W. Ginsberg, T. Limperis, “Geometrical considerations and nomenclature for reflectance,” Natl. Bur. Stand. (U.S.) Monogr. 160 (1977).
  12. J. E. Proctor, P. Y. Barnes, “NIST high accuracy reference reflectometer-spectrophotometer,” J. Res. Natl. Inst. Stand. Technol. 101, 619–627 (1996). [CrossRef]
  13. P. J. Caber, “Interferometric profiler for rough surfaces,” Appl. Opt. 32, 3438–3441 (1993). [CrossRef] [PubMed]
  14. L. Deck, P. de Groot, “High-speed noncontact profiler based on scanning white-light interferometry,” Appl. Opt. 33, 7334–7338 (1994). [CrossRef] [PubMed]
  15. T. Doi, T. V. Vorburger, P. Sullivan, “Effects of defocus and algorithm on optical step height calibration,” Proc. Eng. 23, 135–143 (1999). [CrossRef]
  16. WYKO NT-2000, Veeco Metrology Group, Tucson, Ariz. 85706.
  17. Zygo New View 5030, Zygo Corporation, Middlefield, Conn. 06455–0448.
  18. B. Bhushan, J. C. Wyant, C. L. Koliopoulos, “Measurement of surface-topography of magnetic tapes by Mirau interferometry,” Appl. Opt. 24, 1489–1497 (1985). [CrossRef]
  19. K. Creath, “Comparison of phase-measurement algorithms,” K. Creath, ed., Proc. SPIE680, 19–28 (1986).
  20. E. Marx, T. V. Vorburger, “Windowing effects on light scattered by sinusoidal surfaces” in Optical Scattering: Applications, Measurement, and Theory II, J. C. Stover, ed., Proc. SPIE1995, 2–14 (1993). [CrossRef]
  21. E. Marx, T. R. Lettieri, T. V. Vorburger, “Light scattering by sinusoidal surfaces: illumination windows and harmonics in standards,” Appl. Opt. 34, 1269–1277 (1995). [CrossRef] [PubMed]
  22. D. E. Barrick, “Grazing behavior of scatter and propagation above any rough surface,” IEEE Trans. Antennas Propag. 46, 73–83 (1998). [CrossRef]
  23. E. Marx, “Integral equations for scattering by a dielectric,” IEEE Trans. Antennas Propag. 32, 166–172 (1984). [CrossRef]
  24. J. M. Elson, J. M. Bennett, “Vector scattering theory,” Opt. Eng. 18, 116–124 (1979).
  25. B. N. Taylor, C. E. Kuyatt, “Guidelines for evaluating and expressing the uncertainty of NIST measurement results,” (National Institute of Standards and Technology, Washington, D.C., 1994).

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