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Applied Optics

Applied Optics


  • Vol. 40, Iss. 13 — May. 1, 2001
  • pp: 2183–2189

Synthesis of thick optical thin-film filters with a layer-peeling inverse-scattering algorithm

Johannes Skaar, Ligang Wang, and Turan Erdogan  »View Author Affiliations

Applied Optics, Vol. 40, Issue 13, pp. 2183-2189 (2001)

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We present an efficient and accurate method for synthesis of optical thin-film structures. The method is based on a differential inverse-scattering algorithm and considers therefore both phase and amplitude reflectance data. We apply the algorithm to the synthesis of filters with arbitrary index layers and two-material filters consisting of only high- and low-index layers. The layered structure is approximated by a stack of discrete reflectors with equal distance between all reflectors. This mirror stack is in turn determined from the desired, complex reflection spectrum by a layer-peeling inverse-scattering algorithm. The complexity of the design algorithm is approximately the same as that of the forward problem of computing the spectrum from a known structure.

© 2001 Optical Society of America

OCIS Codes
(310.0310) Thin films : Thin films

Original Manuscript: June 8, 2000
Revised Manuscript: November 21, 2000
Published: May 1, 2001

Johannes Skaar, Ligang Wang, and Turan Erdogan, "Synthesis of thick optical thin-film filters with a layer-peeling inverse-scattering algorithm," Appl. Opt. 40, 2183-2189 (2001)

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