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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 40, Iss. 15 — May. 20, 2001
  • pp: 2368–2375

Modified Ångström exponent for the characterization of submicrometer aerosols

Norm T. O’Neill, Oleg Dubovik, and Tom F. Eck  »View Author Affiliations


Applied Optics, Vol. 40, Issue 15, pp. 2368-2375 (2001)
http://dx.doi.org/10.1364/AO.40.002368


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Abstract

The classical Ångström exponent is an operationally robust optical parameter that contains size information on all optically active aerosols in the field of view of a sunphotometer. Assuming that the optical effects of a typical (radius) size distribution can be approximated by separate submicrometer and supermicrometer components, we show that one can exploit the spectral curvature information in the measured optical depth to permit a direct estimation of a fine-mode (submicrometer) Ångström exponent (α f ) as well as the optical fraction of fine-mode particles (η). Simple expressions that enable the estimation of these parameters are presented and tested by use of simulations and measurements.

© 2001 Optical Society of America

OCIS Codes
(010.1290) Atmospheric and oceanic optics : Atmospheric optics
(280.1100) Remote sensing and sensors : Aerosol detection

History
Original Manuscript: May 25, 2000
Revised Manuscript: January 11, 2001
Published: May 20, 2001

Citation
Norm T. O’Neill, Oleg Dubovik, and Tom F. Eck, "Modified Ångström exponent for the characterization of submicrometer aerosols," Appl. Opt. 40, 2368-2375 (2001)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-40-15-2368

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