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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 40, Iss. 16 — Jun. 1, 2001
  • pp: 2755–2768

Real-time total integrated scattering measurements on the Mir spacecraft to evaluate sample degradation in space

James B. Hadaway, Anees Ahmad, J. Larry Pezzaniti, Russell A. Chipman, Donald R. Wilkes, Leigh L. Hummer, David G. Crandall, and Jean M. Bennett  »View Author Affiliations


Applied Optics, Vol. 40, Issue 16, pp. 2755-2768 (2001)
http://dx.doi.org/10.1364/AO.40.002755


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Abstract

An instrument to measure total integrated scattering (TIS) in space was built as part of the Optical Properties Monitor instrument package and flown on the Russian Mir Space Station in a low Earth orbit. TIS at two wavelengths was measured in space at approximately weekly intervals from 29 April to 26 December 1997 and telemetered to Earth during the mission. Of the 20 TIS samples, 13 are described here to illustrate the performance of the TIS instrument. These include ten optical samples and three thermal control samples. Two optical samples and one thermal control sample were severely degraded by atomic oxygen. All samples received a light dusting of particles during the mission and an additional heavier layer after the samples returned to Earth. The initial brassboard instrument and the validation tests of the flight instrument are also described.

© 2001 Optical Society of America

OCIS Codes
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(230.4040) Optical devices : Mirrors
(240.6700) Optics at surfaces : Surfaces
(290.5820) Scattering : Scattering measurements
(290.5880) Scattering : Scattering, rough surfaces
(350.6090) Other areas of optics : Space optics

Citation
James B. Hadaway, Anees Ahmad, J. Larry Pezzaniti, Russell A. Chipman, Donald R. Wilkes, Leigh L. Hummer, David G. Crandall, and Jean M. Bennett, "Real-time total integrated scattering measurements on the Mir spacecraft to evaluate sample degradation in space," Appl. Opt. 40, 2755-2768 (2001)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-40-16-2755


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