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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 40, Iss. 16 — Jun. 1, 2001
  • pp: 2788–2795

Characterization of highly absorbing black appliqués in the infrared

Steven R. Meier  »View Author Affiliations


Applied Optics, Vol. 40, Issue 16, pp. 2788-2795 (2001)
http://dx.doi.org/10.1364/AO.40.002788


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Abstract

Angular and polarimetric directional hemispherical reflectance (DHR) measurements of three highly absorbing appliqués in the 2.5–14.3-µm IR spectral region are presented. In addition, scanning electron microscopy (SEM) images are presented to probe the surface morphology of these appliqués. DHR measurements of Energy Science Laboratory, Incorporated (ESLI), Rippey, and Rodel appliqués were obtained at incidence angles of 8°, 30°, and 50° and as a function of S, P, and unpolarized incident light. The ESLI appliqué exhibited the lowest DHR for all angles and incident polarization states. SEM images revealed a fibrous structure for the ESLI appliqué with fiber diameters of the order of 7–8 µm, whereas the Rippey and the Rodel appliqués showed spongelike surfaces with pore diameters of 40–50 and 30–40 µm, respectively. All the appliqués use cavities or fibers in conjunction with carbon compounds to absorb IR radiation. The optical system designed to perform these measurements, a method for correcting off-normal DHR measurements in center-mount integrating spheres, and sources of measurement error are also discussed.

© 2001 Optical Society of America

OCIS Codes
(120.3150) Instrumentation, measurement, and metrology : Integrating spheres
(160.4670) Materials : Optical materials
(160.4760) Materials : Optical properties
(290.5880) Scattering : Scattering, rough surfaces
(300.0300) Spectroscopy : Spectroscopy

History
Original Manuscript: October 24, 2000
Revised Manuscript: February 21, 2001
Published: June 1, 2001

Citation
Steven R. Meier, "Characterization of highly absorbing black appliqués in the infrared," Appl. Opt. 40, 2788-2795 (2001)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-40-16-2788


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References

  1. S. M. Pompea, R. P. Breault, Handbook of Optics, II (McGraw-Hill, New York, 1995), Chap. 37.
  2. M. J. Persky, “Review of black surfaces for space-borne infrared systems,” Rev. Sci. Instrum. 70, 2193–2217 (1999). [CrossRef]
  3. S. R. Meier, M. L. Korwin, C. I. Merzbacher, “Carbon aerogel: a new nonreflective material for the infrared,” Appl. Opt. 39, 3940–3944 (2000). [CrossRef]
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  5. Direct inquiries to Tim Knowles at the Energy Science Laboratories, 6888 Nancy Ridge Road, San Diego, Calif. 92121.
  6. Direct inquiries to Chris Bhaten at the Rippey Corporation, 5000 Hillsdale Circle, El Dorado Hills, Calif. 95762.
  7. Direct inquiries to Tara MacDonald at Rodel, 9495 E. San Salvador Drive, Scottsdale, Ariz. 85258.
  8. The mention of manufacturers and model names is intended solely for the purpose of technical information to the reader and should not be construed as an endorsement of the named manufacturer or product.
  9. A Guide to Integrating Sphere Photometry and Radiometry, Labsphere Technical Guide (Labsphere, Incorporated, North Sutton, N.H., 1994), pp. 5–6.
  10. S. G. Kaplan, L. M. Hanssen, “FT-IR based polarimeter with high-quality Brewster angle polarizers,” in Optical Diagnostic Methods for Inorganic Transmissive Materials, R. J. Datlu, L. M. Hanssen, eds., Proc. SPIE3425, 239–247 (1998). [CrossRef]
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  13. F. E. Nicodemus, J. C. Richmond, J. J. Hsia, I. W. Ginsberg, T. Limperis, “Geometric considerations and nomenclature for reflectance,” NBS Monogr. 160 (U.S. Department of State, Washington, D.C., 1977).
  14. S. R. Meier, R. G. Priest, “Mueller matrix measurements of black and white materials in the infrared,” in Polarization Analysis and Measurement III, D. B. Chenault, M. J. Duggin, W. G. Egan, D. H. Goldstein, eds., Proc. SPIE4133, 82–91 (2000).

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