Characterization of highly absorbing black appliqués in the infrared
Applied Optics, Vol. 40, Issue 16, pp. 2788-2795 (2001)
http://dx.doi.org/10.1364/AO.40.002788
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Abstract
Angular and polarimetric directional hemispherical reflectance (DHR) measurements of three highly absorbing appliqués in the 2.5–14.3-μm IR spectral region are presented. In addition, scanning electron microscopy (SEM) images are presented to probe the surface morphology of these appliqués. DHR measurements of Energy Science Laboratory, Incorporated (ESLI), Rippey, and Rodel appliqués were obtained at incidence angles of 8°, 30°, and 50° and as a function of S, P, and unpolarized incident light. The ESLI appliqué exhibited the lowest DHR for all angles and incident polarization states. SEM images revealed a fibrous structure for the ESLI appliqué with fiber diameters of the order of 7–8 μm, whereas the Rippey and the Rodel appliqués showed spongelike surfaces with pore diameters of 40–50 and 30–40 μm, respectively. All the appliqués use cavities or fibers in conjunction with carbon compounds to absorb IR radiation. The optical system designed to perform these measurements, a method for correcting off-normal DHR measurements in center-mount integrating spheres, and sources of measurement error are also discussed.
© 2001 Optical Society of America
[Optical Society of America ]
OCIS Codes
(120.3150) Instrumentation, measurement, and metrology : Integrating spheres
(160.4670) Materials : Optical materials
(160.4760) Materials : Optical properties
(290.5880) Scattering : Scattering, rough surfaces
(300.0300) Spectroscopy : Spectroscopy
Citation
Steven R. Meier, "Characterization of highly absorbing black appliqués in the infrared," Appl. Opt. 40, 2788-2795 (2001)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-40-16-2788
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