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Applied Optics

Applied Optics


  • Vol. 40, Iss. 16 — Jun. 1, 2001
  • pp: 2788–2795

Characterization of highly absorbing black appliqués in the infrared

Steven R. Meier  »View Author Affiliations

Applied Optics, Vol. 40, Issue 16, pp. 2788-2795 (2001)

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Angular and polarimetric directional hemispherical reflectance (DHR) measurements of three highly absorbing appliqués in the 2.5–14.3-µm IR spectral region are presented. In addition, scanning electron microscopy (SEM) images are presented to probe the surface morphology of these appliqués. DHR measurements of Energy Science Laboratory, Incorporated (ESLI), Rippey, and Rodel appliqués were obtained at incidence angles of 8°, 30°, and 50° and as a function of S, P, and unpolarized incident light. The ESLI appliqué exhibited the lowest DHR for all angles and incident polarization states. SEM images revealed a fibrous structure for the ESLI appliqué with fiber diameters of the order of 7–8 µm, whereas the Rippey and the Rodel appliqués showed spongelike surfaces with pore diameters of 40–50 and 30–40 µm, respectively. All the appliqués use cavities or fibers in conjunction with carbon compounds to absorb IR radiation. The optical system designed to perform these measurements, a method for correcting off-normal DHR measurements in center-mount integrating spheres, and sources of measurement error are also discussed.

© 2001 Optical Society of America

OCIS Codes
(120.3150) Instrumentation, measurement, and metrology : Integrating spheres
(160.4670) Materials : Optical materials
(160.4760) Materials : Optical properties
(290.5880) Scattering : Scattering, rough surfaces
(300.0300) Spectroscopy : Spectroscopy

Original Manuscript: October 24, 2000
Revised Manuscript: February 21, 2001
Published: June 1, 2001

Steven R. Meier, "Characterization of highly absorbing black appliqués in the infrared," Appl. Opt. 40, 2788-2795 (2001)

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