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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 40, Iss. 19 — Jul. 1, 2001
  • pp: 3196–3204

Integrating-Sphere System and Method for Absolute Measurement of Transmittance, Reflectance, and Absorptance of Specular Samples

Leonard Hanssen  »View Author Affiliations


Applied Optics, Vol. 40, Issue 19, pp. 3196-3204 (2001)
http://dx.doi.org/10.1364/AO.40.003196


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Abstract

An integrating-sphere system has been designed and constructed for multiple optical properties measurement in the IR spectral range. In particular, for specular samples, the absolute transmittance and reflectance can be measured directly with high accuracy and the absorptance can be obtained from these by simple calculation. These properties are measured with a Fourier transform spectrophotometer for several samples of both opaque and transmitting materials. The expanded uncertainties of the measurements are shown to be less than 0.003 (absolute) over most of the detector-limited working spectral range of 2 to 18 μm. The sphere is manipulated by means of two rotation stages that enable the ports on the sphere to be rearranged in any orientation relative to the input beam. Although the sphere system is used for infrared spectral measurements, the measurement method, design principles, and features are generally applicable to other wavelengths as well.

© 2001 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3150) Instrumentation, measurement, and metrology : Integrating spheres
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.4570) Instrumentation, measurement, and metrology : Optical design of instruments
(120.5700) Instrumentation, measurement, and metrology : Reflection
(120.7000) Instrumentation, measurement, and metrology : Transmission

Citation
Leonard Hanssen, "Integrating-Sphere System and Method for Absolute Measurement of Transmittance, Reflectance, and Absorptance of Specular Samples," Appl. Opt. 40, 3196-3204 (2001)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-40-19-3196


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References

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