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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 40, Iss. 22 — Aug. 1, 2001
  • pp: 3753–3758

Measurement of Birefringence of Low-Loss, High-Reflectance Coating of M-Axis Sapphire

Jordan B. Camp, William Kells, Martin M. Fejer, and Eric Gustafson  »View Author Affiliations


Applied Optics, Vol. 40, Issue 22, pp. 3753-3758 (2001)
http://dx.doi.org/10.1364/AO.40.003753


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Abstract

The birefringence of a low-loss, high-reflectance coating applied to an 8-cm-diameter sapphire crystal grown in the <i>m</i>-axis direction has been mapped. By monitoring the transmission of a high-finesse Fabry–Perot cavity as a function of the polarization of the input light, we find an upper limit for the magnitude of the birefringence of 2.5 × 10<sup>−4</sup> rad and an upper limit in the variation in direction of the birefringence of 10 deg. These values are sufficiently small to allow consideration of <i>m</i>-axis sapphire as a substrate material for the optics of the advanced detector at the Laser Interferometer Gravitational Wave Observatory.

© 2001 Optical Society of America

OCIS Codes
(230.0230) Optical devices : Optical devices
(240.0310) Optics at surfaces : Thin films

Citation
Jordan B. Camp, William Kells, Martin M. Fejer, and Eric Gustafson, "Measurement of Birefringence of Low-Loss, High-Reflectance Coating of M-Axis Sapphire," Appl. Opt. 40, 3753-3758 (2001)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-40-22-3753

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