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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 40, Iss. 24 — Aug. 20, 2001
  • pp: 4113–4133

Advances in surface-light-scattering instrumentation and analysis: noninvasive measuring of surface tension, viscosity, and other interfacial parameters

William V. Meyer, Gerard H. Wegdam, Denis Fenistein, and J. Adin Mann, Jr.  »View Author Affiliations


Applied Optics, Vol. 40, Issue 24, pp. 4113-4133 (2001)
http://dx.doi.org/10.1364/AO.40.004113


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Abstract

A new generation of vibration-mitigating surface-light-scattering instrumentation has been designed and built. The computational application of an instrument function derived by use of Fourier optics is presented. This instrument and its accompanying suite of analysis software allow us to easily make accurate and noninvasive measurements of the interfacial tension, volume viscosity, and other interfacial parameters of fluids. We derived the necessary surface response function algorithms to study both simple fluids and binary fluids at their wetting transition and near their critical points. These developments can be applied to study systems with liquid–vapor and liquid–liquid interfaces, including spread monolayers, whenever optical access for a laser beam is available.

© 2001 Optical Society of America

OCIS Codes
(290.0290) Scattering : Scattering
(300.6490) Spectroscopy : Spectroscopy, surface

History
Original Manuscript: December 20, 2000
Revised Manuscript: April 23, 2001
Published: August 20, 2001

Citation
William V. Meyer, Gerard H. Wegdam, Denis Fenistein, and J. Adin Mann, "Advances in surface-light-scattering instrumentation and analysis: noninvasive measuring of surface tension, viscosity, and other interfacial parameters," Appl. Opt. 40, 4113-4133 (2001)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-40-24-4113


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References

  1. R. V. Edwards, R. S. Sirohi, J. A. Mann, L. B. Shih, L. Lading, “Surface fluctuation scattering using grating heterodyne spectroscopy,” Appl. Opt. 21, 3555–3568 (1982). [CrossRef] [PubMed]
  2. L. Lading, J. A. Mann, R. V. Edwards, “Analysis of a surface-scattering spectrometer,” J. Opt. Soc. Am. A 6, 1692–1701 (1989). [CrossRef]
  3. W. V. Meyer, J. A. Lock, H. M. Cheung, T. W. Taylor, P. Tin, J. A. Mann, “A hybrid reflection–transmission surface light scattering instrument with reduced sensitivity to surface sloshing,” Appl. Opt. 36, 7605–7614 (1997). [CrossRef]
  4. J. W. Goodman, Introduction to Fourier Optics, McGraw-Hill Classic Textbook Reissue Series (McGraw-Hill, New York, 1968), p. 287.
  5. J. A. Mann, “Surface light scattering spectroscopy,” in Proceedings of the NATO Advanced Research Workshop on Light Scattering and Photon Correlation Spectroscopy, Vol. 40 of NATO ASI Series, 3. High Technology, E. R. Pike, J. B. Abbiss, eds. (Kluwer, Dordrecht, 1997), p. 97–115.
  6. D. Fenistein, G. H. Wegdam, W. V. Meyer, J. A. Mann, “Capillary waves on an asymmetric liquid film of pentane on water,” Appl. Opt. 40, 4134–4139 (2001).
  7. J. A. Mann, P. D. Crouser, W. V. Meyer, “Surface fluctuation spectroscopy by surface-light-scattering spectroscopy,” Appl. Opt. 40, 4092–4112 (2001). [CrossRef]
  8. D. Langevin, ed., Light Scattering by Liquid Surfaces and Complementary Techniques, 1st ed., Vol. 41 of Surfactant Science Series, M. J. Schick, F. M. Fowkes, eds. (Marcel Dekker, New York, 1992).
  9. A. E. Smart, R. V. Edwards, W. V. Meyer, “Quantitative simulation of errors in correlation analysis,” Appl. Opt. 40, 4064–4078 (2001). [CrossRef]
  10. J. A. Mann, “Dynamics, structure and function of interfacial regions,” Langmuir 1, 10–23 (1985). [CrossRef]
  11. R. S. Hansen, J. A. Mann, “Propagation characteristics of capillary waves,” J. Appl. Phys. 35, 152–158 (1964). [CrossRef]
  12. W. H. Press, S. A. Teukolsky, W. T. Vetterling, B. P. Flannery, Numerical Recipes in C. The Art of Scientific Computing, 2nd ed. (Cambridge U. Press, Cambridge, UK, 1999). Note that formula 4.5.9 for determining the weights ωin is missing a factor of 2 in the numerator. This can be confirmed by comparing ∫-∞+∞ exp[-x2]x2 dx = π1/2/2 to ∑i=-nn ωinf(uin); other even powers of u in f(x) = xu will also show this. Moreover, π1/2 = ∑i=-nn ωin to 13 significant figures.
  13. M. Abramowitz, I. A. Stegun, eds., Handbook of Mathematical Functions (Dover, New York, 1972).
  14. C. L. Yaws, “Library of physico-chemical-property data,” in Handbook of Viscosity (Gulf, Houston, Tex., 1997). Note that other literature values for acetone indicate that the correction shown below is needed for the exponent for the Yaws acetone surface tension extrapolation formula:surfaceTensionLitValue=surfaceTensionAtRefTempInKelvin×critcalTempInKelvin − tempInKelvincritcalTempInKelvin − refTempInKelvin1.4728.
  15. R. V. Edwards, Western, Case Western Reserve University, Cleveland, Ohio (personal communication, 1985).
  16. E. O. Brigham, The Fast Fourier Transform (Prentice-Hall, Englewood Cliffs, N.J., 1974).

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