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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 40, Iss. 25 — Sep. 1, 2001
  • pp: 4519–4525

Surface effects of the HgI2 crystal characterized by spectroscopic ellipsometry

Aotmane En Naciri, Luc Johann, Roland Kleim, Manuel Sieskind, and Marianne Amann  »View Author Affiliations


Applied Optics, Vol. 40, Issue 25, pp. 4519-4525 (2001)
http://dx.doi.org/10.1364/AO.40.004519


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Abstract

We report on determination of the surface effects of mercuric iodide (HgI2) uniaxial HgI2 optical parameters with a fixed-polarizer, rotating-polarizer, and fixed-analyzer spectroscopic ellipsometer (PRPSE) after chemical polishing. The characteristics of the chemical complex [KHgI3,H2O] that forms on the HgI2 surface during KI etching have been investigated over the spectral range from 400 to 800 nm. Surface roughness and effects of the ellipsometric parameters of HgI2 were treated, and the thickness of the layer formed on the surface was determined and analyzed by PRPSE. The surface roughness was modeled with the Bruggeman effective medium approximation.

© 2001 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(120.5700) Instrumentation, measurement, and metrology : Reflection
(120.6660) Instrumentation, measurement, and metrology : Surface measurements, roughness
(260.1180) Physical optics : Crystal optics
(310.6870) Thin films : Thin films, other properties

History
Original Manuscript: November 14, 2000
Revised Manuscript: April 23, 2001
Published: September 1, 2001

Citation
Aotmane En Naciri, Luc Johann, Roland Kleim, Manuel Sieskind, and Marianne Amann, "Surface effects of the HgI2 crystal characterized by spectroscopic ellipsometry," Appl. Opt. 40, 4519-4525 (2001)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-40-25-4519


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References

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