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Applied Optics

Applied Optics


  • Vol. 40, Iss. 26 — Sep. 10, 2001
  • pp: 4716–4720

Experimental study on nonuniformity of line jitter in CCD images

Gang Luo, Opas Chutatape, and Hui Fang  »View Author Affiliations

Applied Optics, Vol. 40, Issue 26, pp. 4716-4720 (2001)

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The line jitter of CCD images can considerably influence the precision and resolution of a high-accuracy vision-based automated inspection system. We report the experimental studies on the line jitter of CCD images. By use of a method of Harr wavelet transform, correlation, and statistics analysis to detect the line jitter of subpixels, the experiment reveals that the line jitter exhibits inherent nonuniformity and that different CCD cameras have different jitter characteristics. It was commonly thought that the jitter could be eliminated by detection of the jitter level and performing compensation. However, the nonuniformity revealed in the experiment makes jitter compensation much harder.

© 2001 Optical Society of America

OCIS Codes
(040.1520) Detectors : CCD, charge-coupled device
(120.3940) Instrumentation, measurement, and metrology : Metrology
(150.0150) Machine vision : Machine vision

Original Manuscript: November 17, 2000
Revised Manuscript: April 13, 2001
Published: September 10, 2001

Gang Luo, Opas Chutatape, and Hui Fang, "Experimental study on nonuniformity of line jitter in CCD images," Appl. Opt. 40, 4716-4720 (2001)

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