Experimental Study on Nonuniformity of Line Jitter in CCD Images
Applied Optics, Vol. 40, Issue 26, pp. 4716-4720 (2001)
http://dx.doi.org/10.1364/AO.40.004716
Acrobat PDF (107 KB)
Abstract
The line jitter of CCD images can considerably influence the precision and resolution of a high-accuracy vision-based automated inspection system. We report the experimental studies on the line jitter of CCD images. By use of a method of Harr wavelet transform, correlation, and statistics analysis to detect the line jitter of subpixels, the experiment reveals that the line jitter exhibits inherent nonuniformity and that different CCD cameras have different jitter characteristics. It was commonly thought that the jitter could be eliminated by detection of the jitter level and performing compensation. However, the nonuniformity revealed in the experiment makes jitter compensation much harder.
© 2001 Optical Society of America
OCIS Codes
(040.1520) Detectors : CCD, charge-coupled device
(120.3940) Instrumentation, measurement, and metrology : Metrology
(150.0150) Machine vision : Machine vision
Citation
Gang Luo, Opas Chutatape, and Hui Fang, "Experimental Study on Nonuniformity of Line Jitter in CCD Images," Appl. Opt. 40, 4716-4720 (2001)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-40-26-4716
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