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Applied Optics

Applied Optics


  • Vol. 40, Iss. 26 — Sep. 10, 2001
  • pp: 4728–4737

Scattering measurements on optical disks and their relation to media noise

Xiaodong Xun, Chubing Peng, Kimihiro Saito, and Masud Mansuripur  »View Author Affiliations

Applied Optics, Vol. 40, Issue 26, pp. 4728-4737 (2001)

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We have conducted measurements of scattered light from bare polycarbonate and glass substrates and from complete optical disks using a He–Ne laser beam in different polarization states and at different angles of incidence. The results are compared with the measured media noise obtained from the same disks on a dynamic tester. Both the scattered light and the media noise originate from the jaggedness and other imperfections of the groove structure, the roughness of the substrate’s surface, and the inhomogeneities of the bulk of the substrate. Although some sources of media noise manifest themselves in the scattered light distribution, others cannot be easily detected by this type of measurement.

© 2001 Optical Society of America

OCIS Codes
(240.5770) Optics at surfaces : Roughness

Original Manuscript: January 29, 2001
Revised Manuscript: May 29, 2001
Published: September 10, 2001

Xiaodong Xun, Chubing Peng, Kimihiro Saito, and Masud Mansuripur, "Scattering measurements on optical disks and their relation to media noise," Appl. Opt. 40, 4728-4737 (2001)

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  1. D. Treves, D. S. Bloomberg, “Signal, noise, and codes in optical memories,” Opt. Eng. 25, 881–891 (1986). [CrossRef]
  2. C. Peng, M. Mansuripur, “Sources of noise in erasable optical disk data storage,” Appl. Opt. 37, 921–928 (1998). [CrossRef]
  3. Y. Honguh, “Analysis of retrieval signal deterioration caused by disk surface roughness,” Jpn. J. Appl. Phys. Suppl. 28-3, 115–119 (1989).
  4. K. A. Rubin, M. Chen, “Progress and issues of phase-change erasable optical recording media,” Thin Solid Films 181, 129–139 (1989). [CrossRef]
  5. K. Saito, N. Miyagawa, M. Mansuripur, “Optical disk noise analysis using rigorous vector diffraction calculations,” in 2000 Optical Data Storage Topical Meeting (Institute of Electrical and Electronics Engineers, Piscataway, N.J., 2000), pp. 56–58.
  6. M. Nakada, M. Okada, “Disk noise of quadrilayer MnBi magneto-optical disks,” Jpn. J. Appl. Phys. Part 1 33, 6577–6581 (1994). [CrossRef]
  7. J. M. Bennett, L. Mattsson, Introduction to Surface Roughness and Scattering (Optical Society of America, Washington, D.C., 1989).
  8. J. C. Stover, Optical Scattering: Measurement and Analysis (McGraw-Hill, New York, 1990).
  9. E. L. Church, H. A. Jenkinson, J. M. Zavada, “Relationship between surface scattering and microtopographic features,” Opt. Eng. 18, 125–136 (1979). [CrossRef]
  10. C. Zerrouki, F. Miserey, P. Pinot, “Light scattering angular distribution of a mirror-polished CoCr20WNi (alacrite XSH); application to the determination of statistical parameters characterizing the surface roughness,” Eur. Phys. J. Appl. Phy. 1, 253–259 (1998). [CrossRef]
  11. M. Bernt, J. C. Stover, “Roughness measurement of dielectrics with light scatter,” in Optical Scattering in the Optics, Semiconductor, and Computer Disk Industries, J. C. Stover, ed., Proc. SPIE2541, 36–44 (1995). [CrossRef]
  12. J. M. Elson, J. M. Bennett, J. C. Stover, “Wavelength and angular dependence of light scattering from beryllium: comparison of theory and experiment,” Appl. Opt. 32, 3362–3376 (1993). [CrossRef] [PubMed]
  13. V. Twersky, “Reflection coefficients for certain rough surfaces,” J. Appl. Phys. 24, 659–660 (1953). [CrossRef]
  14. L. Li, “New formulation of the Fourier modal method for crossed surface-relief gratings,” J. Opt. Soc. Am. A 14, 2758–2767 (1997). [CrossRef]
  15. C. Peng, M. Mansuripur, M. Ikenishi, M. Miura, “Substrate noise in optical data-storage systems,” Appl. Opt. 40, 3379–3386 (2001). [CrossRef]

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